Design of Automated Chip Inspection Platform

Kehong Li

《International Core Journal of Engineering》 7卷10期 (2021/10) Pp. 66-74

https://doi.org/10.6919/ICJE.202110_7(10).0013

摘要

Automated defect detection technology can effectively improve the production efficiency of manufacturing enterprises, and it is an important means and method for today's enterprises to realize industrial transformation and upgrading. This transformation is particularly important for the development of small and medium -sized enterprises in the field of industrial electronic equipment manufacturing. At present, defect detection based on machine vision is a popular research channel to realize automatic defect detection technology. This paper takes an ultra-thin gigabit single-port network transformer chip product as the carrier, and proposes a system study of automatic defect detection technology based on machine vision to remove and sort the defective chip products in the manufacturing process. This research focused on the development of an efficient, accurate and stable automatic defect detection platform for ultra-thin gigabit single-port network transformer chip products. In this regard, the research content of this paper mainly focuses on the four aspects of detection platform design, vision system setting, image analysis and processing, and control system realization.

關鍵字

PLC ； Machine Vision ； Defect Detection ； Automation

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