馬達驅動控制器之量化可靠度研究

Quantitative Reliability Study of Motor Control Units

鄭星山(Sing-Shien Cheng)

指導教授 ： 吳文方

國立臺灣大學/工學院/機械工程學研究所/碩士(2013年)

https://doi.org/10.6342/NTU.2013.10877

摘要

電動車具有低汙染、低噪音等優點，未來將成為市場主流，取代現有汽車。因應電動車及其他車用電子/電機系統的蓬勃發展，國際標準組織ISO推出了汽車電子/電機系統專用功能性安全標準ISO 26262。為幫助國內電動車產業將來能順利與全球市場接軌，本研究聚焦於ISO 26262第五章「硬體次系統層級」，以國內製造的一組50 kW電動車馬達驅控器為研究對象，探討如何將ISO 26262實施至該馬達驅控器上。本研究除記載馬達驅控器之DFMEA (Design Failure Mode and Effect Analysis)外，特別探討驅控器與元件的失效率，期能滿足ISO 26262的要求。本研究分別使用「MIL-HDBK-217F N2」與「FIDES 2009」兩套方法計算系統與各元件的失效率與平均失效間隔時間(Mean Time Between Failure、簡稱MTBF)，並探討兩種方法的優缺點；在DFMEA方面，本研究改良廠商提供的既有DFMEA表格，特別的，在各元件「發生度」因樣本數太少難以決定情況下，改以前述各元件計算所得的失效率重新評估發生度，同時也探討各元件的風險指標。研究結果發現馬達驅控器的MTBF，MIL-HDBK-217F N2的計算結果為11到57年，FIDES的計算結果約為21年；根據DFMEA，風險數較高的元件依序為鋁質電解電容、DSP及IGBT等。

關鍵字

ISO 26262 ； 馬達驅控器 ； 失效率 ； 失效模式與影響性分析

並列摘要

The International Organization for Standardization (ISO) has already launched ISO 26262 for automotive electronic/electrical systems which is a standard for functional safety. To help domestic manufacturers integrate smoothly their electric vehicles and components with global market, Part 5 of ISO 26262 namely ‘Product Development: Hardware Level’ is studied in detail in this thesis. 50-kW motor control unit (MCU) made in a domestic research institute is taken as an example to demonstrate how ISO 26262 can be implemented. Special attention is paid to DFMEA (Design Failure Mode and Effect Analysis) and failure rate estimation of the MCU and its components to examine whether they meet requirements of ISO 26262. To obtain meaningful failure rates, MIL-HDBK-217F N2 and FIDES 2009 are referred to, in which Fides is a DGA (French armament industry supervision agency) study conducted by a European consortium formed by eight industrialists including AIRBUS France, Eurocopter, Nexter Electronics, etc. from the fields of aeronautics and defense. The mean time between failure (MTBF) of each component and system is predicted as well. Comparison is made between results obtained from the two methods. With regard to DFMEA, an improved version of DFMEA resulting table is provided over the original one provided by the institute who made the MCU. The occurrence rate or occurrence frequency for each component is estimated and tabulated in the table. Risk indicators and their relative rakings for all components are found. Both of them are considered important issues in ISO 26262. The results showed that the MTBF of MCU, MIL-HDBK-217F N2 evaluates 11~57 years, FIDES calculations about 21 years; and according to DFMEA, the higher order RPN of component of MCU are Al capacitors, DSP and IGBT etc.

並列關鍵字

ISO 26262 ； MCU ； failure rate ； FMEA

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