多重掃描鏈時序錯誤診斷

Diagnosis of Multiple Scan Chain Timing Faults

莊惟舜(Wei-Shun Chuang)

指導教授 ： 李建模

國立臺灣大學/電機資訊學院/電子工程學研究所/碩士(2007年)

https://doi.org/10.6342/NTU.2007.01626

摘要

本論文提出一個掃描鏈診斷技術可定位掃描鏈上的多重時序錯誤。跳躍模擬是一種新穎的平行模擬技術，儘管時序錯誤之間會產生互動，此技術仍能快速找出每個個別錯誤的上邊界及下邊界。此項技術只需要一般的自動測試向量即可，不需要特殊的診斷向量，使得這項技術對生產測試環境上的診斷非常有用。在ISCAS’89基準電路的實驗顯示，即使在一條超過八百個掃描細胞的掃描鏈上有十六個保持時間錯誤，此項技術能夠相當成功的指出幾乎每個錯誤的位置。當錯誤資料相當有限或是錯誤叢聚在一起時，本論文提出的技術仍然十分有效。

關鍵字

掃描鏈 ； 錯誤診斷 ； 自動向量產生

並列摘要

This thesis presents a diagnosis technique to locate multiple timing faults in scan chains. Jump simulation is a novel parallel simulation technique which quickly searches for the upper and the lower bounds of every individual fault, in spite of the interaction of multiple faults. This technique requires only regular ATPG patterns, not specialized diagnosis patterns, which make it very useful for diagnosis in the production test environment. Experiments on ISCAS’89 benchmark circuits show that, this technique can successfully pinpoint almost every one of sixteen hold-time faults in a scan chain of more than 800 scan cells. The proposed technique is still effective when the failure data is limited or the faults are clustered.

並列關鍵字

Fault diagnosis ； ATPG ； scan chain

參考文獻

[Edirisooriya 95] S. Edirisooriya, and G. Edirisooriya, “Diagnosis of Scan Path Failures,” Proc. IEEE VLSI Test Symp., pp. 250-255, 1995.

[Guo 01] R. Guo, and S. Venkataranman, “A Technique for Fault Diagnosis of Defects in Scan Chains,” Proc. IEEE Int’l Test Conf., pp. 268-277, 2001.

[Hirase 99] J. Hirase, N. Shindou, and K. Akahori, “Scan Chain Diagnosis Using IDDQ Current Measurement,” Proc. Asian Test Symp. pp. 153-157, 1999.

[Huang 03] Y. Huang, W.-T. Cheng, S. M. Reddy, C.-J. Hsieh, and Y.-T. Hung, “Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault,” Proc. IEEE Int’l Test Conf., pp. 319-327, 2003.

[Huang 05] Y. Huang, W.-T. Cheng, and J. Rajski, “Compressed Pattern Diagnosis for Scan Chain Failures,” Proc. IEEE Int’l Test Conf., paper 30.3, 2005.