在本論文中,我們使用一套遠場光學量測系統測量入射光與金奈米天線(兩根串聯的奈米金棒) 之光跟物質的交互作用。此系統有兩種測量的架構,分別為偏振對比顯微術與雷射聚焦式暗視野顯微術。偏振對比顯微術可以量測到入射平行光與奈米天線產生交互作用後所激發的表面電漿共振模態,並且隨著改變不同入射角度去分析模態的變化。雷射聚焦式暗視野顯微術則可以量測雷射聚焦光點與金奈米天線交互作用之暗視野影像,進而分析影像可得到金奈米天線散射光場的耦合效應。此外,我們使用聚焦式顯微光譜儀量測奈米天線的穿透光譜,可得到表面電漿共振波長在兩根金棒距離不同時的變化。本論文研究結果可以做為未來奈米尺度下表面電漿積體光學元件的基石。
In this paper, we use the far-field optical systems to measure the interaction of the gold nano-antenna with the incident light. There are two types of the measurement systems, including the polarization-contrast microscopy and the laser focal dark field microscopy. The polarization-contrast microscopy is used to attain far-field optical images of the surface plasmon resonance (SPR) modes in the gold nano-antenna. And the laser focal dark field microscopy is used to measure the interaction of the laser spot with the gold nano-antenna. According to the dark field images, we can analyze the coupling effect of the gold nano-antenna. Furthermore, we use the microscope spectrometer systems to measure the transmission spectrum of the gold nano-antenna. From the spectrum, the SPR wavelength changed with different length of the gold nano-rod gap. Our research can function as fundamental building blocks in nano-plasmonic integrated optics.