利用原子力顯微鏡探討聚吡咯-陽極氧化鋁薄膜超電容之電容衰退特性

Study on degradation of pollypyrrole / anodic aluminum oxide supercapacitor utilizing atomic force microscopre

蔡宗樺(Tsung-Hua Tsai)

指導教授 ： 施文彬

國立臺灣大學/工學院/機械工程學研究所/碩士(2012年)

https://doi.org/10.6342/NTU.2012.02865

摘要

無資料

關鍵字

聚吡咯 ； 陽極氧化鋁薄膜 ； 超電容 ； 非接觸聚合 ； 原子力顯微鏡 ； 衰退

並列摘要

In the field of supercapacitors, the degradation of capacitance caused from the volume change during redox was being mentioned for a long time. But there were few people studied it.
In this thesis, we used anodic aluminum oxide (AAO) as the substrate, taking advantage of the high specific surface area and synthesized polypyrrole (PPy) on it to make a supercapacitor electrode. The method which used to synthesize PPy was called indirect method. Atomic force microscope (AFM) scanning and cyclic voltammetry (CV) test were operated simultaneously to analyze the porosity change of the PPy film. The porosity of the PPy film was determined by an imaging program.
Due to the hole structure of the AAO, the stress occurred within redox did not cause obvious damage on the film so the electrodes showed very good cyclic stability.

並列關鍵字

polypyrrole ； anodic aluminum oxide ； supercapacitor ； indirect method ； atomic force microscope ； degradation

參考文獻

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