動態的軟性錯誤率模擬器

由宇宙射線所引起的軟性錯誤，會在奈米層級的超大型積體電路設計上導致嚴重的可靠性問題。如果我們要發展相關的軟性錯誤容錯技術，首先我們必須先分析軟性錯誤在系統階級影響的效應。在這篇論文中，我們在元件庫特徵化的基礎上，提出一個依據於樣本的軟性錯誤率計算方法來計算組合電路和序向電路。我們發展了一個動態的軟性錯誤率模擬器。我們使用 ISCAS'89和ITC'99中的基準電路來比較我們提出的方法與使用HSpice模擬的差異性。我們所提出的方法比使用HSpice模擬快了5 ~ 6個數量級，而誤差只在3%以內。

關鍵字

軟性錯誤；動態

並列摘要

Soft errors due to cosmic rays cause an important reliability problem for nano-scale VLSI designs. If we want to develop the related soft error tolerant techniques, first we need to analyze the effect of soft errors at the system level. In this thesis, we propose a pattern-dependent soft error rate computation technique based on cell library characterization for combinational circuits and sequential circuits. We develop a dynamic soft error rate simulator. We use benchmark circuits from ISCAS’89 and ITC’99 to compare our proposed technique with HSpice simulation. Our proposed technique is 5 ~ 6 orders of magnitude speed-up over HSpice simulation with less than 3% error.

並列關鍵字

soft error ； dynamic

參考文獻

[1] Fan Wang and Vishwani D. Agrawal, “Single Event Upset: An Embedded Tutorial,” in 21st International Conference on VLSI Design, January, 2008, pp. 429-434.

[3] Sheng Weiguang, Xiao Liyi, and Mao Zhigang, “Fast soft error rate computing technique based on state probability propagating,” in 4th IEEE Conference on Industrial Electronics and Applications (ICIEA), May 2009, pp. 734-738.

[5] M. Omana, G. Papasso, D. Rossi, and C. Metra, “A Model for Transient Fault Propagation in Combinatorial Logic,” in Proc.9th IEEE On-Line Testing Symposium, 2003, pp. 111-115.

[6] Peter Hazucha and Christer Svensson, “Impact of CMOS Technology Scaling on the Atmospheric Neutron Soft Error Rate,” in IEEE Transactions on Nuclear Science, Vol. 47, No. 6, Dec, 2000, pp. 2586-2594.

[7] Fred L. Yang and Resve A. Saleh, “Simulation and Analysis of Transient Faults in Digital Circuits,” in IEEE J. Solid State Circuits, vol. 27, no.3, March 1992, pp. 258-264.

國際替代計量

動態的軟性錯誤率模擬器

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