本研究係以射頻反應式磁控濺鍍的方法,透過斜角沉積的技術成長銦錫氧化 物(Indium Tin Oxide,ITO)導電層於玻璃基板上。利用改變基板傾斜角方式,濺鍍 不同角度之ITO 薄膜,觀察成長出來的ITO 奈米柱薄膜之表面與橫截面。隨著 傾斜角度的增加,ITO 奈米柱狀薄膜的折射率會減少,這是因為ITO 奈米柱狀薄 膜中的氧含量增加,但銦和錫的含量減少所導致。 最後利用以不同傾斜角度沉積,可以得到不同折射率之ITO 薄膜的特性。 製作改變折射率的ITO 薄膜,製作GaN LED 的透明導電膜。實驗結果顯示,奈 米柱ITO 薄膜當做導電層。
This work presents a nanocolumnar structure anisotropic indium tin oxide (ITO) film deposited with different oblique-angle by a radio-frequency magnetron sputtering system for glass substrate. Sputtering the different angle of ITO films by oblique-angle to tilt the angle of substrate, and the morphology and cross-sectional structure was observed. The refractive index of ITO nanocolumnar films decreases with incidence angle increases. This may attribute by the oxygen increases into ITO nanocolumnar films but Indium and Tin decreases. After The method use to the GaN-based LED with an anisotropic ITO nanocolumnar .