干涉技術量測光纖被動元件色散特性之研究

DISPERSION MEASUREMENT OF FIBER PASSIVE COMPONENTS BY INTERFEROMETRIC TECHNIQUE

陳建銘(Jian-Ming Chen)

指導教授 ： 張明文 ； 柯正浩

元智大學/工程學院/電機工程學系/碩士(2004年)

摘要

本論文中，我們提出簡單又準確的量測架構來同時量測光纖被動元件之波長相關色散特性。其主要原理是利用麥克森干涉儀來比較光訊號由待測試光纖被動元件與反射鏡之反射時間差，架構中只採用寬頻光源與光譜儀等常用設備（就一般光纖被動元件廠均會具備這些設備）來量測訊號，透過適當的訊號處理，即可計算出相關特性曲線。本論文希望透過開發出經濟又準確性高的光纖被動元件色散量測系統，以降低光纖被動元件的量測成本，進而增加其市場競爭力。相關量測架構亦可能成為光纖被動元件產業之生產線隨時可架設起來的經濟量測系統。

關鍵字

波長相關色散 ； 麥克森干涉儀

並列摘要

We propose the measurement techniques for the chromatic dispersion and the polarization-mode dispersion of the fiber grating devices in this project. Applying a Michelson interferometer, the time delay difference between the lights reflected by the fiber grating and the mirror can be measured. We use a broadband source and an optical spectrum analyzer, which are the popular instruments in the fiber-optic passive device companies, to measure the optical signal spectra in the measurement setups. Applying some signal processing skills, the dispersion curves of a fiber grating can be determined. We hope using the development of the low-cost and high-accuracy measurement techniques, the cost of the fiber gratings can be reduced, and the competition of the fiber grating products can be increased. Furthermore, the associated measurement techniques may be the easy-setting and low-cost measurement systems in the production line of the fiber-optic passive device companies.

並列關鍵字

chromatic dispersion ； Michelson interferometer