一種新型的雙向光學元件網路分析儀探頭

A New Two-Way Probe of Optical Component Network Analyzer

劉代祺(Tai-Chi Liou)

指導教授 ： 曹士林

元智大學/工程學院/電機工程學系/碩士(2000年)

摘要

本文提出一種新型的雙向光學元件網路分析儀探頭: 此探頭最大特色在於其為「雙向式」測量，對於有關光學元件之S參數頻率響應快速測量將有極大的助益。此新型之探頭可與目前市場上各廠商之微波網路分析儀結合使用，可應用於雙向S11，S12，S21，S22之光學元件參數測量，改良原有微波網路分析儀需拆裝元件，更換方向才能測量參數之缺點。在實際應用上，我們應用了三種不同光學濾波器來驗證此架構，實驗及模擬上也獲得一不錯之結果。

關鍵字

光學元件網路分析儀 ； 光測試設備 ； S參數 ； 2維週期結構 ； 校準 ； 分頻器

並列摘要

In this thesis, a new probe of two-way optical component network analyzer is proposed. Combined this new probe proposed in this thesis with commercialized network analyzer, one can measure the S11，S12，S21，S22 parameters of optical devices with fast two-way measurement. Traditionally, if one would like to measure the four S-parameters of two-port optical devices, the devices should be disconnected and put in the opposite direction to test again during the measurement procedure. We can improve such convention and reduce the human errors induced by the disconnection in this thesis. In the application, we use three types of ring filter as our test samples. Comparing the numerical and experimental results, we find two results have good coincidence.

並列關鍵字

lightwave network analyzer ； optical test set ； S parameter ； 2D grating ； caliabration ； frequency division multiplexer

參考文獻

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