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  • 學位論文

電子零組件失效分析方法及失效模式之研究

Study of failure analysis method and failure model for electronic devices

指導教授 : 劉宗平
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摘要


失效分析的主要目的,在幫助設計者及生產者共同探究元件失效之原因,找尋防止失效的方案,以確保產品的品質,進而提昇產業之競爭力。因此,如何有效地進行失效分析並建構適當的相關程序,遂成為本研究中失效分析課題所追求的目標。 本文論述之重點在於:探討電子零組件失效分析的方法與失效模式之建構。其內容包含失效分析的步驟、應用的工具以及相關問題的探討及解決。在本文中,首先針對分析儀器及其相關的測試方法進行瞭解,並由實際工作的眾多案例中篩選出5個案例,藉以說明失效分析進行的步驟、流程及方法。並且,適時地選用精密的科技儀器,作更進一步的探討,以便深入地確認可能造成失效的因素,建立合理適用的數據資料庫。 在未來研發的工作中,失效現象是否會重蹈覆轍,失效模式的建立,將是一項非常艱鉅的工程。在本文中,同時還對1021個試件模組資料進行統計與分析,歸納出環境應力試驗項目中的失效模式,並針對失效案例進行原因分類與研究。

關鍵字

HASH(0xbfa6710)

並列摘要


The main purpose of failure analysis is used to assist the designers and manufacturers to analyze the factors of failure of an element and explore the solutions in order to improve the quality of the products and rise the compete ability of the industry. Therefore, how effectively to execute the failure analysis and constructing the related procedures are the main goals of this study. The present works were concentrated on the failure analysis method of the electronic devices and the construction of the failure model. The major work includes the procedure of failure analysis, experimental tools, and the solutions of related problems. In this study, we should first make understandings of the equipments and related information. Among enormous real elements, five cases were chosen to study the procedure and method for failure analysis. For constructing a suitable and useful database, the required equipments to probe the causes of failure must properly be selected. The construction of failure model is a hard work since it can affect the failure event to be occurred again or not. In this study, the data based on 1021 modules were analyzed statistically; the failure model was introduced induced in the test items of environmental testing and category of failure causes were investigated.

並列關鍵字

HASH(0xbfa67e8)

參考文獻


9.宜特科技股份有限公司網站, 網址 ttp://www.isti.com.tw/chinese/
2.MIL-STD-810F, "environmental engineering considerations and laboratory tests", 2000.
1.MIL-STD-883E, "department of defense test method standard microcircuits", 1996.
3.甘翠華, 劉宗平, "電子零組件的失效分析", 第六屆中華民國實驗室管理與認證論文發表. 民國90年, p.80.
4.陳力俊等著, "材料電子顯微鏡學", 科儀叢書, 修定再版, 新竹, 行政院國家科學委員會精密儀器發展中心, 民國八十三年, p.352-389.

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