射頻模組測試治具設計製作與特性擷取分析

RF Module Test Fixture Design and Characterization

李允正(Yun-Cheng Lee)

指導教授 ： 黃建彰

元智大學/工程學院/通訊工程學系/碩士(2006年)

摘要

在射頻元件的測試上需要與一般較低頻類比及數位測試治具特別的射頻專用測試治具，然而一般性能較佳的測試治具往往售價頗高。為了因應產線大量測試時需要低成本的需求，所以尋求價格較低、射頻特性可被接受且便於自行設計製作的射頻測試治具，是測試開發需要努力的方向。
本篇論文在設計適用於無線網路SIP (System in Package)模組的射頻測試治具。首先依照產品封裝結構、售價考量及射頻訊號需求選擇治具類型，並用電磁模擬軟體模擬輔助設計出符合特性要求的治具。再以網路分析儀校正原理延伸出擷取測試治具模型的方法，並將其程式化便於快速量測及計算分析。最後另設計取得整個測試治具需補償的傳輸損耗值及判定治具堪用與否的產線測試，完成整個射頻測試治具開發程序。

關鍵字

無線網路 ； 電磁模擬 ； 射頻元件 ； 特性擷取

並列摘要

In the RF component tests there are special requirements for the test fixtures than the low-frequency ones either for analog or digital parts. Usually the high performance test fixtures are quite expensive and become the major bottlenecks for the mass production. To reduce the testing fixture costs with acceptable RF performance, the in-house design of the RF test fixture is needed for the manufacture consideration.
This thesis designs and characterizes a RF testing fixture for the mass-production testing requirements of WLAN SiP (System in Package) modules. The selection of the test fixtures based on the package type, cost, and RF signal requirement is evaluated firstly with the verifications of EM simulations. Secondly the characterization of the test fixture via the network analyzer measurement are performed with the proper calibration technique and the software automation, ensuring the fixture availability accurately and quickly to compensate the transmission-loss or judge the socket wok or not in the production-line operations. The two-step procedures complete the development of the RF test fixture numerically and experimentally.

並列關鍵字

WLAN ； EM simulations ； RF component ； Characterization

參考文獻

[13] Leaded Series 4mm Spec Sheet, Johnstech International Corporation.

Note, Agilent Technologies, 2002.

Technologies, 2001.

[3] 黃士釗, 〈錫球陣列載具電路模型之建立〉，成功大學碩士論文，2003。

[5] 陳建志，〈適用於三接收機網路分析儀之改良式TRL校正方式〉，成功大學碩士論文，2003。