小波分析LCD面板瑕疵之研究

A study of defects of LCD panel with wavelet method

陳錦宗(chin-chung chen)

指導教授 ： 劉宗平

元智大學/工程學院/電機工程學系/碩士(2006年)

https://doi.org/10.6838/YZU.2006.00139

摘要

在液晶顯示器(LCD)面板的表面上，它是由垂直與水平的規則紋路所構成。所以面板表面上瑕疵的微觀檢測可以採用小波分析技術來進行檢測與分析。由於小波分析具有多尺度(multi-scale)、多解析(multi-resolution)的能力，對多尺度的功能而言，可經由增加解析的階數，可進行局部多個細節與平滑子影像之分析，能夠更有效地分離規則紋路與瑕疵。多解析技術能夠將影像分解成平滑子影像及細節子影像，它可分離影像中重複性之規則紋路與瑕疵。本研究利用小波分析技術中之影像分解與影像重構，以及小波分析的多尺度和多解析之能力，配合影像還原低頻部分(平滑部分)影像來凸顯微觀瑕疵。經實驗結果顯示：本研究方法對LCD面板之微觀瑕疵的檢測具有良好顯著之檢測效果。

關鍵字

小波變換 ； 液晶顯示器

並列摘要

On the surface of LCD panel, it consists of the horizontal and vertical regularized-textures. By using the techniques of image decomposition and image restoration scheme of wavelet transform, we can detect the micro-defect on the surface. In automatic surface inspection, the capability of multi-scale and multi-resolution of wavelet ensures that we can use the forward wavelet transform to decompose an original image into smooth and detailed subimages in different multi-resolution levels, and restore specific subimages by using the backward wavelet transform to separate defects from regular textured surfaces. The regular textures here can be structural textures, such as machined surfaces, and statistical textures, such as cast surfaces. By properly selecting the decomposed subimages and the number of multi-resolution levels, the restored image will remove repetitive texture patterns and retain only local anomalies.
In this research we aim at detecting micro-defect by the image decomposition and imagine-restoration of wavelet with multi-scale and multi-resolution. It is evident that our proposed method is really effective for detecting defect of LCD panels through the results of experiments.

並列關鍵字

wavelet ； TFT-LCD

參考文獻

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