微共振腔一般應用於半導體雷射、有機發光二極體 (OLED) 等元件,目的在於強化特定波長的輸出強度。一般我們所知道的微共振腔由一對反射鏡與腔體組成;其中一個反射鏡是電極金屬,另一個反射鏡是薄膜堆疊鏡,是由高低折射率的兩種介電質薄膜層,以四分之一波長光學厚度相互堆疊形成介電質鏡 (quarter wave stack,QWS) 。此微共振腔可以視為內部有電偶極光源的 Fabry-Perot 的裝置,本研究採用 QWS 並且安插更高倍數光學厚度的介電質層來改變共振腔的共振特性,稱為高階共振薄膜。高階共振薄膜於垂直視角時,可以在可見光頻譜範圍內擁有多於一個的共振波長,對於 OLED 色彩的純化,與變化組合,有很大的應用潛力。我們模擬計算在側視角變化時,高階共振薄膜共振條件的改變,並追蹤輸出光的強度效益與色度的改變,做為評估高階共振薄膜設計的依據。
Microcavity is usually applied to the semiconductor laser and Organic Light-Emitting Diodes (OLEDs) ; the purpose is to enhance the output intensity for specific wavelength. Usually the microcavity is composed of a pair of reflectors and the cavity. One of them is metal electrode, the other is a thin film stack mirror, which constitute the low/high refractive dielectric layer and use quarter wave stack thickness to build the (quarter wave stack,QWS). Microcavity structure is viewed as the emission from the electric dipoles inside Fabry-Perot device. This research uses QWS to provide placement for higher multiple optical thickness of dielectric to change the resonance characteristic of resonant cavity, called the microcavity of higher order. As the Microcavity of higher order was laid in vertical, it has more resonant wavelength in visible light spectrum scoop, having great potential applications for OLED chromaticity accuracy as well as the change combination. When simulate-counting the change in angle of view, we change the microcavity conditions of higher order, trace the beneficial for output intensity and change of chromaticity, taken to be the basis of the valuation design for microcavity of higher order.