應用加速壽命試驗於產品保固之研究~以五埠集線器為例

The Application of Accelerated Life Test to Product Warranty ~ A Case Study of 5 Port Hub.

王麟群(Lin-Chun Wang)

指導教授 ： 張 百 棧 博士

共同指導教授 ： 彭 鴻 霖 博士(Dr. Horng-Linn Perng)

元智大學/工程學院/工業工程與管理學系/碩士(2006年)

https://doi.org/10.6838/YZU.2006.00192

摘要

本研究分為兩部份，第一部份是以五埠集線器為研究之對象，利用加速壽命測試做為規劃，以環境溫度作為測試時之加速應力，所採用的加速模式為阿倫尼爾斯模式，試圖在短時間內獲取其壽命值及產品失效數據。期間也與傳統的可靠度預估做比較；第二部份是假設五埠集線器在市場上使用時，分為正常品與瑕疵品的組合，所得到的失效回饋數據，亦為正常品與瑕疵品的失效混合數據，此模式稱為不完美轉換指數分配模式。利用案例公司客退產品數據，配合曲線配適法以符合指數分配不完美轉換模式，最後可求得正常品失效率、瑕疵品失效率、瑕疵品比例以及早夭失效曲線。
加速壽命試驗失效率值，代入不完美轉換指數分配模式，以求出產品一年內失效比例為8.22%，代表的意義為出廠產品100台，將有9台會回廠。

關鍵字

不完美轉換指數分配模式 ； 加速壽命試驗 ； 阿倫尼爾斯模式 ； 平均失效間隔時間 ； 客退產品 ； 保固

並列摘要

The research is divided into two parts: the first one introduces a test for accelerating a product’s lifetime; 5-port hub product is used as the test subject and Arrhenius Model as the speeding tool. The environmental temperature is the speeding stress and the purpose is to obtain the product’s life value and failure rate in a short time. The experimental results are compared with those by conventional approaches to reliability analysis. In the second part, it is hypothesized that both normal and defective 5-port hubs are used in the market, and the failure rate obtained is a mixture number from normal and defective goods. This model is the so-called Chance Defective Exponential (CDE) Model. The data gained from the Return Material Authorization (RMA) of a company are used. By combining Curve fitting with CDE Model, the failure rates of normal and defective goods, and the proportion of defects are acquired and the early failure curve is depicted.
The failure rate from Accelerated Life Test is employed into the CDE Model to find out that the failure percentage of a product within one year is 8.22%, which means that around 9 out of 100 sold goods will be returned to the manufacturer.

並列關鍵字

Chance Defective Exponential (CDE) Model ； Accelerated Life Test ； Arrhenius Model ； Mean Time Between Failure(MTBF) ； Return Material Authorization(RMA) ； Warranty

參考文獻

【楊義明等 04】楊義明、盤天培、鄭鴻業，2004 “加速壽限試驗”,品質月刊,第40卷9期 pp84-86.

【劉祖榮 04】 劉祖榮，2004 “ SDRAM產品預燒時間之研究”中原大學工業工程系碩士論文.

【MIL-HDBK-338A 88】，1988“Electronic Reliability Design Handbook”

【Bellcore 95】，1995“Reliability Prediction Prcedure for Electronic Equipment”

【Dercoix 99】 DerCoix and Gregory A.，1999.“Optinal Warranties, Reliabilites and Price for Durable Goods in An Oligopoly,”eruopean Journal of operational research,, Vol.112,pp554-569.