- 學位論文
整合田口方法與損益平衡分析於最佳化太陽能晶片之厚度特性
Optimizing the Thickness Characteristics the of Solar Chip by Integrating Taguchi Method and Break-even Analysis
摘要
隨著全世界環保意識的高漲及溫室效應所造成的自然災害日益嚴重，突顯出以太陽能這種潔淨能源發電的重要性將日益提高。太陽能相關的產品目前在市場上已開有始逐漸上揚的訂單需求。為了提高公司的營收，各太陽能工廠無不想盡辦法持續提高現有產品之生產良率。本研究以太陽能晶片產品之退貨不良率為主要改善方向，同時利用損益平衡法協助找出了不良率改善之臨界點與不良率改善幅度，並確定了太陽能之晶片厚度為本文此次之主要改善對象。本研究並且藉由田口方法與敏感度分析之搭配，以快速有效的實驗安排及分析過程亦大大的縮短了改善時程。研究案例在短時間內獲得良好之晶片厚度品質改善，把晶片厚度不良率從0.83% 降為0.36%，並減少每年約1,785,000元之退貨損失。
並列摘要
With the rising environmental awareness around the world and the greenhouse effect caused by natural disasters, the importance of the clean solar energy has gained the attention. The market of the solar energy products has gradually increased in various demands. In order to improve the company's profits, the solar plants have tried to improve the yields of existing products. The study subject was the characteristic of thickness of the solar chip. In this study, the defect ratio of customer return was evaluated. Moreover, the break-even analysis was used to find out the critical point of defect ratio and the product improvement range. The effective experimental arrangement of Taguchi methods and sensitivity analysis methods was used to improve the quality of thickness of the solar chip. The defect ratio of the thickness of solar chip has reduced from 0.83% to 0.36%, and the customer return loss has decreased by an amount of 1,785,000 dollars per year.