低崩潰電壓矽鍺雪崩光電探測器(APD)使用分離式放大和吸收結構, 分別是橫向矽雪崩二極體和垂直矽鍺光偵測器。由於製程條件與標準相容於CMOS工藝,極具潛力並應用於電子和矽光子積體化的高性能的接收器
A low breakdown voltage Ge/Si avalanche photodetector (APD) was demonstrated using a separated multiplication and absorption structure with lateral Si avalanche pin and vertical Ge/Si pin. Because the process condition is compatible with standard CMOS process, it is potential to be integrated with other electronics and Si photonics and applied for high-performance optical receivers