摘要 利用分子束磊晶技術成長了兩套量子井結構,分別為碲化鋅/碲x硒1-x化鋅(碲濃度為0.46和0.78)和硒化鋅/硒1-y硫y化鎂x鋅1-x(鎂濃度為0.03,硫濃度為0.09)多重量子井結構,並藉由光激螢光譜量測其光學特性。 第一套樣品為第二型的碲化鋅/碲x硒1-x化鋅多重量子井結構,其電子侷限在碲x硒1-x化鋅層中,而電洞侷限碲化鋅層中。在光激螢光譜下,由於碲化鋅/碲x硒1-x化鋅多重量子井屬於第二型,當溫度在70到90K以上時,可發現光激螢光的強度會迅速的衰減。利用變溫光激螢光譜的積分亞倫尼斯 (Arrhenius)圖法得到激子活化能之值隨著碲x硒1-x化鋅層的厚度改變。利用縱向光學聲子、雜質及聲學聲子等互動參數作為隨著溫度改變之光激螢光譜線寬之理論模擬分析,可得到雜質束縛能量隨著碲x硒1-x化鋅層的厚度增加而減少。 另一套樣品為第一型的硒化鋅/硒1-y硫y化鎂x鋅1-x(鎂濃度為0.03,硫濃度為0.09)多重量子井結構,電子和電洞都侷限在硒化鋅層中。激子活化能值隨著硒化鋅層而增加。利用縱向光學聲子、雜質及聲學聲子等互動參數作為隨著溫度改變之光激螢光譜線寬之理論模擬分析,得到雜質束縛能量隨著硒化鋅層厚度而增加。
Abstract
We present photoluminescence (PL) spectra from two sets of samples, ZnTe/ZnSe1-xTex (x = 0.46 and 0.78) and ZnSe/Zn1-xMgxSySe1-y (x = 0.03, y = 0.09) multiple quantum wells (MQW), grown on GaAs (001) substrates by molecular beam epitaxy (MBE). A type II band alignment was found in the ZnTe/ZnSe1-xTex quantum well system. Electron is confined in the ZnSe1-xTex layer while hole is localized in the ZnTe layer. At temperature was above 70~90K, inter-band optical emission intensity dropped rapidly. Activation energies calculated from the arrhenius plot of the integrated PL vary with the ZnSe1-xTex layer thickness. The temperature dependent PL line-width broadening was fitted byΓ(T)=Γ0+Γa T+ΓLO/[exp(ħωLO / kT)-1] + Γi exp(-