GOA液晶面板 Array佈局設計與Array檢測

在平面顯示器市場中，窄邊框液晶顯示器是屬高品質產品。我們常使用出貨交期短的非晶矽陣列製程生產，而較不使用出貨交期長之低溫多晶矽陣列製程生產。 a-Si液晶顯示器增加了窄邊框規格，最佳之方法是將掃描線驅動電路於陣列製程中完成。於本論文中我們定義了一種掃描線驅動電路陣列之檢測方法及方式。 GOA電路包含閂鎖電路及緩衝電路。GOA電路需要一個低VIA接觸電阻在陣列製程中完成。VIA層主要是要將GE層-SD層金屬之接觸層。在陣列檢測中，有兩套檢測系統，分別為探針檢測系統及非接觸式檢測系統。我們提昇改造現在檢測方式及方法使其可檢測GOA液晶面板。我們分析TFT元件欠陷open/short狀態、時序圖並建立歸納表，供檢測程式開發時確認使用。

關鍵字

掃描線驅動電路；檢測；欠陷；佈局；窄邊框

並列摘要

The narrow bezel TFT LCD is a high quality product in flat panel display market. We usually use the a-Si array process, because it is short lead time than LTPS array process lead time. The a-Si TFT LCD would increase the narrow bezel specification. Completing the gate driver circuitry during array processing is an optimal solution. In this article, we present a layout for the a-Si LCD scan-line driver array and define a testing method for the gate driver array circuit. It is include the latch circuit and buffer circuit in GOA circuit. Then, we need a low VIA ( metal - metal ) resistance for GOA circuit, we include the VIA layer in array process. The VIA layer is a GE-SD contact layer. We have two type array testing system, they are the full contact array testing and noncontact array testing. We will upgrade the array testing function for GOA TFT LCD in array testing. We will analysis the open/short TFT defect and check clock chart in GOA circuit. Then, we build a defect check list for array testing modify.