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  • 學位論文

液晶平面顯示器關鍵零組件彩色濾光片缺陷檢測及分析

Key spare parts of Color Filter Defect Inspect and analyze for Thin Film Transistor Liquid Crystal Display

指導教授 : 劉益宏

摘要


本技術報告主要是探討,『TFT-LCD關鍵零組件之彩色濾光片,在各個製程的瑕疵分析與分類』。此技術報告將介紹說明近年來面板被大量的使用,使得其需求量大增,因此所有面板廠無不增加面板產量和研發新尺寸。然而在面板的製造流程中,面板常會因外在環境及機台本身之因素出現瑕疵,造成面板良率下降、成本增加,為了改善此問題,目前面板廠皆設有線中檢查機制,即在製造流程中進行玻璃基板抽樣檢查的工作,以防止大量不良面板之發生。但目前的檢查機制僅能進行抽檢動作,且皆為人工處理,為取代人力、增加處理速度,讓面板進行全檢並即時傳送相關資訊給線上工程師,因此導入即時且自動化之檢查機台系統是有必要的。 就目前彩色濾光片廠所使用的檢測機台一般來說可分成檢查設備、量測設備和修整設備等三類。彩色率光片經過上述三種類別檢測機台把關後,經過工程人員的經驗法則即可判斷出產品的不良原因,並將不良品分類及修復。由於目前的瑕疵辨識仍然仰賴大量人工進行,而使用人工的缺點除了檢測效率差之外,其主觀的判斷亦容易造成檢測上的誤判。因此本份技術報告將先介紹彩色濾光片的製作流程及線中檢驗方式,接下來針對各個製程的設備以及瑕疵成因進行解析,最後將會說明本廠所評估由日商TAKANO所開發出的『自動化欠陷分類系統』進行測試的結果,以及彩色濾光片未來的檢測需求。

並列摘要


The technical report is to explore “key components of TFT-LCD color filter’s defect analysis and classification in various manufacturing process”. In this report, we will introduce the panel that in recent years has been a lot of use, makes its demand increased, so panel manufacturing plant to increase production and research and development of large size panels. However, the panel defects generated due to manufacturing environment and machine’s stability, resulting in panel yield fell, the cost increased .In order to improve this problem, In-line MQC mechanisms are established that glass substrates are inspected by a randomly sampling ratio in manufacturing process to prevent the occurrence of a large number of unqualified panels. But the current in-line MQC mechanisms are operated under a sampling ratio and are handled manually. To reduce human power, increase processing speed, inspect entire glass substrates and pass relative information to the online engineers immediately. Therefore, it is necessary to introduce automatic inspection machine system. The examination equipment presently used in color filter fab includes inspection, measurement and repair equipment. Color filter is examined by the above-mentioned equipment and judged by the experience of the engineers to determine the defect reason. Then the defect is classified and repaired. The defect determination depends on a large number man-work, but the efficiency of man-wok is worse and the subjective man judgments often cause misjudgment. This technical report will introduce the manufacture procedure and the inspection method of color filter. Then the equipment of the process and the defect cause will be analyzed. In the end, the test result of the “auto defect classification system” developed by TAKANO and the future examination requirement of color filter will be described.

並列關鍵字

Color Filter TFT-LCD Defect Classification

參考文獻


[8] 林思賢,”應用視覺及資料探勘技術於TFT-LCD陣列電路工程線中瑕疵辨識之研究-源/汲電極光罩瑕疵自動分類系統開發,” 中原大學機械工程系研究所,2006年。
[10] 王信陽,“TFT-LCD關鍵零組件左右廠商勝負”,光電科技工業協會,2004年。
[11] 李秋緯,“面板廠產線調整對面板產品的影響”, 拓墣產業研究所,2008年。
參考文獻
[1] 顧鴻壽,光電液晶平面顯示器-技術基礎及運用,新文京開發出板股份有限公司,2004年3月二版。

被引用紀錄


盧嘉隆(2010)。運用實驗計畫法改善彩色濾光片黑色矩陣製程白欠陷之研究〔碩士論文,中原大學〕。華藝線上圖書館。https://doi.org/10.6840/cycu201000916

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