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  • 學位論文

以電漿輔助式分子束磊晶法成長垂直準直的 氧化鋅奈米針及其特性分析

Growth and characteristics of vertically-aligned ZnO nanoneedle arrays by plasma-assisted molecular beam epitaxy

指導教授 : 王智祥

摘要


本論文運用電漿輔助式分子束磊晶技術,直接於三氧化二鋁基板(0001)面上以不添加任何催化劑的方式,磊晶準直的氧化鋅奈米針(ZnO nanoneedle)。我們藉由掃描式電子顯微鏡(Scanning Electron Microscopy ; SEM)來觀察氧化鋅樣品的表面形貌,並發現磊晶條件在II/VI族配比為鋅過量條件下有氧化鋅奈米針的形成,相對氧過量條件下的氧化鋅表面是平坦的,猜測可能的原因是較多的鋅聚集扮演了成核中心的角色。本文主要探討氧化鋅奈米針的形成過程,以及氧化鋅奈米針的光學及場發射特性。我們藉由掃描式電子顯微鏡測量氧化鋅奈米針的高度約300 nm、直徑約40 nm,其針狀密度大約109 cm-2。在針狀與薄膜氧化鋅樣品中,我們從低溫光激螢光光譜圖的分析可發現氧化鋅奈米針的光學性質比氧化鋅薄膜好,由陰極射線激發螢光影像(Cathode-luminescence)知道氧化鋅奈米針樣品的主要發光來源是針狀結構。我們遵循Fowler–Nordheim 方程式對氧化鋅奈米針的場發射電流進行分析,並比較場發射增強因子。

並列摘要


Well vertically-aligned ZnO nanoneedle arrays have been grown on C-Al2O3 substrates by using plasma-assisted molecular beam epitaxy (PA-MBE). Scanning electron microscopy (SEM) shows the ZnO nanoneedles formed only under Zn-rich growth conditions, suggesting the Zn droplets probably play the role of the nucleation sites. The ZnO nanoneedles are about 300 nm in height and 40 nm in diameter with the needle density of about 109 cm-2. Cathode-luminescence (CL) images directly visualize strong luminescence from the individual needles. Low-temperature photoluminescence (PL) measurements reveal the ZnO needles with higher intensity and smaller full width at half maximum (FWHM) than the ZnO thin films. Field electron emission of those nanoneedle arrays was also investigated. The field emission current as a function of the applied electrical field follow the Fowler–Nordheim (F–N) equation.

並列關鍵字

nanoneedle field emission ZnO MBE

參考文獻


J. E. Jang, K. W. Min, S. H. Cho, M. J. Yoon, J. S. Lee, C. K. Lee, J. H.
Lett. 80, 4045 (2002)
Pham, R. He and H. J. Choi, Adv. Funct. Mater. 12, 323 (2002)
5. M. H. Huang, S. MaO, H. Feick, H. Yan, Y. Wu, H. Kind, E. Weber, R. Russo,
and P. Yang, Science 292, 1897 (2001)

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