金奈米線於拉伸試驗下之電性研究

奈米線為目前廣泛應用的奈米結構，已被證實具有獨特的電性和優異的機械性能，並從過去研究中發現，在奈米尺度下的非導體材料，經由施予外力後可轉變為半導體材料，因此本研究探討金奈米線在拉伸試驗下的導電特性，以了解奈米線導體材料受力後的電性變化。　　實驗係透過架設於掃描電子顯微鏡內部真空腔的奈米操控系統執行，將奈米操作平台上的兩支探針置於奈米線兩端，對單根奈米線執行拉伸試驗，在一個固定的電壓下，量測逐步增加張力下的電性變化，並利用掃描電子顯微鏡中的圖像量測金奈米線受力後的伸長量，以了解奈米線在不同應變下的電性狀態。　　實驗結果顯示金奈米線的平均電阻率為1.068 X 10-5 Ω.cm，是金塊材電阻率的4.36倍。當給予金奈米線更大的張力時，則可使金奈米線的電阻率降低。應變相關方面，進行拉伸試驗之過程，電阻率呈現非線性之微小斜率變化。結論顯示應變因素會影響金奈米線之電性，改變其電阻率。

關鍵字

應變；電阻率；金奈米線；掃描電子顯微鏡

並列摘要

Nano-wire has been used in many applications of nano-technology. From several previous researches, it has been confirmed that nano-wire has unique electrical properties and outstanding mechanical properties. In nano-meter scale, non-conductor material which imposed by external forces could become semiconductor materials. So in this investigation, the electrical properties of gold nano-wire had been subjected to the tensile test, in order to understand the effects of external force on gold nano-wires to the electrical characteristics. The experimental system has been set up in the inside of the scanning electron microscope (SEM) vacuum chamber to control and manipulate the system in nano scale. Nano-wire was attached on the nano-manipulator device which has two probes to hold the nano-wire. Electrical measurement and tensile test were also conducted on that nano-manipulator device. In order to understand the nano-wire electrical characteristics at each step of tensile, at certain voltage and changing of the currents were used to investigate the electrical characteristics, furthermore images of scanning electron microscopy were also used to calculate the elongation of gold nano-wire. The results showed that the resistivity of gold nano-wire was 1.068 X 10-5 Ω.cm with average value around 4.36 times greater than bulk material resistivity; the correlation of strain – resistivity has small slope and non-linear while tensile test had been conducted. It means that resistivity as electrical characteristic of gold nano-wire had been changed by the strain.

並列關鍵字

Gold nano-wire ； resistivity ； strain ； Scanning electron microscopy

參考文獻

[16] 張鋒政, “金奈米線機械性質測試技術研究” 中原大學機械學系碩士論文, pp. 5-7, 2009.

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金奈米線於拉伸試驗下之電性研究

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