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  • 學位論文

錫銅鎳銲料之性質研究

The Study of SnCuNi Solder

指導教授 : 鄭俊麟

摘要


本研究之主要目的是以低成本之錫銅系列合金為基材,藉由鎳金屬的添加,製備出新的錫銅鎳系列無鉛合金,希望藉此新系列鉛銲料合金,可以保有原有錫銅合金低成本的特性,同時亦可以改善錫銅或錫銀銅系列合金所具有之銲接缺點。 我們調配不同比例之新錫銅鎳系列合金(Sn-0.7Cu-0.01Ni、Sn-0.7Cu- 0.1Ni、Sn-0.7Cu-0.5Ni及Sn-0.7Cu-1.0Ni),與目前產業界普遍使用之Sn- 3.0Ag-0.5Cu、Sn-0.7Cu無鉛銲接材料,進行銲錫特性比對,藉由相關物理性質的比對,找尋最佳比例的錫銅鎳系列合金。 在本研究我們亦以熱流式熱示掃描卡量計,量測各種成份/比例合金之熔點;以可程式溫/濕控環境試驗機,測試各種合金之降伏強度;以推拉力試驗機,測試各種合金銲點強度;以切片作業搭配掃描式電子顯微鏡,量測沾錫角度及沾錫高度;再以光學顯微鏡,觀察金相組織。藉由這些物理性質的量測,得知Sn-0.7Cu-0.1Ni合金之銲錫特性為最佳,並且不再具有錫銅或錫銀銅系列合金之缺點,其價格亦相對便宜,非常適合作為無鉛波銲製程之銲接材料使用。 最後我們亦以Sn-0.7Cu-0.1Ni合金作為波銲製程之銲接材料,依據一般業界之測試條件進行可靠度試驗及產品壽命評估,並且亦搭配切片分析及金相組織觀察。測試結果顯示,以Sn-0.7Cu-0.1Ni合金為銲料之電子產品,其可靠度試驗及產品壽命均可符合一般業界對電子產品之規格要求。

並列摘要


In this research, the main purpose is using the low cost of Sn-Cu alloy as sills, adding few nickels to prepare the new Sn-Cu-Ni alloys as lead-free solders. To prepare these new lead-free solders in hopes of keeping the low price and improving imperfection characteristic of Sn-Cu、Sn-Ag-Cu solder at the same time. We produce the new prescription of Sn-Cu-Ni alloys with different proportions ( Sn-0.7Cu-0.01Ni、Sn-0.7Cu-0.1Ni、Sn-0.7Cu-0.5Ni & Sn-0.7Cu-1.0Ni) and compare the physical property with Sn-3.0Ag-0.5Cu、Sn-0.7Cu. Base on the physical property comparison, we want to find out the suitable / best composition of Sn-Cu-Ni lead-free solder. We use the Jade DSC to test the melting、chamber to test the creep strength、push/pull test machine to test the bounding strength、cross section& SEM to measure the wetting angle and solder fill rate、optical microscope to check the micro-structure and crystal organization for each alloys. Than right by data of above physical properties, we find that soldering characteristic of Sn-0.7Cu-0.1Ni alloy is the best alloy for solder material. Sn-0.7Cu-0.1Ni alloy no longer have shortcoming as Sn-Cu and Sn-Ag-Cu alloys, and also got low price without expensive metal (Au、Ag..etc). Sn-0.7Cu-0.1Ni alloy/solder shall be suitable and best choice. As the physical property comparison result, we take Sn-0.7Cu-0.1Ni alloy/solder for wave solder process to produce enough lead-free samples. Then, we test the Sn-0.7Cu-0.1Ni samples in the reliability experimental condition of the general industry. We take the samples to do the reliability test、life-test and also combine with cross section analysis and crystal organization checking. The result of the test shows, as the electronic products with Sn-0.7Cu-0.1Ni solders can meet the reliability and life-time requests of the specification for the general industry.

參考文獻


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[19] R. R. Tummala、E. J. Rymaszewski and A. G. Klopfenstein, Microelectronics packaging Handbook, page 221, 1997.

被引用紀錄


邱雅靖(2013)。應用為製造及組裝而設計理論於電子產品製程改善與品質之研究〔碩士論文,中原大學〕。華藝線上圖書館。https://doi.org/10.6840/cycu201300453

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