In this thesis Gaussian beam optical theory is applied to put forward a more accurate equation by which refractive index and thickness of transparent material can be simultaneously calculated within single scan of a novel dual-beam confocal microscope. Specimens of commercial microscope cover glasses, silicon substrate coated with photoresist, and microlens array are being scanned to investigate the accuracy of the proposed method and optical setup. Our experimental results show consistency with results yielded from other reliable imaging methods. We have presented and demonstrated a simple and accurate method for simultaneous measurement of refractive index and thickness of optically transparent media. This technique has potential for bio-imaging and other noncontact imaging applications.