光學同調斷層掃描術於雙折射材料量測之研究

The Study of Birefringence Sample Measurements with Optical Coherence Tomography

黃鐙瑩(Tang-Ying Huang)

指導教授 ： 鄭旭志

國立虎尾科技大學/電機資訊學院/光電與材料科技研究所/碩士(2012年)

摘要

隨著科技文明的發展，在量測技術上，也逐漸的朝著快速、精準度、穩定和非接觸式的掃瞄這些目標發展，而近年來在工業和生醫科技方面都發現一些物體或者是生體組織的折射情形是呈現雙折射性質的，一般常見的掃描架構僅能得到群折射率，無法確切解析正確的雙折射資訊，因此針對雙折射晶體或者是雙折射組織的掃描研究也持續發展中。

　　本論文是應用極化光透過光同調斷層影像掃描(Optical Coherence Tomography OCT)進行雙折射樣品掃描，進行多次量測去分析該雙折射樣品的雙折射現象以及其厚度，OCT架構具備了非侵入式掃描以及高速、穩定的量測形式，研究最後以量測液晶樣品做數據分析及觀察討論。

關鍵字

極化光 ； 光同調斷層影像掃描 ； 雙折射性質 ； 厚度 ； 液晶

並列摘要

Measurement technology is gradually to these goals about high-speed, accuracy, stability and non-contact scanning with the development of science and technology. In recent years, industrial and biomedical technology have found that some objects or biological tissue refraction present the birefringence. Most of the scanning systems only get group refractive index, can not be resolved to the correct information on the birefringent. Therefore, for a birefringent crystal or biological tissue scanning studies have sustainable development.

　　This research is the study of polarized light in optical coherence tomography to measure the birefringence sample.

OCT systems with a non-invasivescanning and high-speed, stable measurement. Finally, we measure the liquid crystal sample data analysis and observation are discussed.

並列關鍵字

polarized light ； optical coherence tomography ； birefringence ； thickness ； liquid crystal

參考文獻

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