半導體從業人員對藥物、毒物監測技術接受度調查

本篇研究針對半導體產業族群進行調查研究，因半導體產業所需執業之環境，常有毒性化學原料暴露的機會，但目前並未有針對特殊環境所制定精準檢測性之標準化程序。此外，欲深入了解長期用藥或特殊用藥之治療下，因個體差異可能導致藥物血中濃度過多，造成藥物毒性，或是藥物血中濃度過低，造成治療失敗的反噬。故可藉由質譜儀的藥物、毒物監測技術，準確控制用藥劑量，避免用藥毒性過高造成的身體危害。因其技術檢測過程中，所需花費之時間、金錢及人力將視性別、專業別及個人家庭狀況情況…等不同而有所差異，並非所有檢測人都能夠接受。目前在質譜儀的開放技術仍尚未到達普及化的程度，在使用技術之前，通常需鎖定要檢測的目標成分，再針對目標去進行研究與分析，因此通常取得的結果將不會是全面性，也因此對於技術開發或檢測人員，通常得針對事件目標來訂定想要發展的技術方向。本研究將探討調查對於藥物、毒物監測技術所需之各類成本負擔之接受程度，並將研究調查結果進行量化統計，歸類各種狀況之可接受範圍，其所帶來的價值，將會給予開發本項專門技術人員具有重要參考指標，可在開發過程中取得更符合大眾需求的數據，藉由了解大眾可接受的方式，延伸開發方向與過程，本篇研究之社群分析係以半導體產業族群為研究對象，限縮取樣範圍使樣本精準度提升，期能給予本項技術能有良好參考指標。

關鍵字

藥物；毒物監測；藥毒性；慢性用藥；用藥過量

並列摘要

People who work in semi-conductive industry usually have higher risk to be exposed to toxicity or chemical materials. Until now, no standard operation procedure has been established for long term monitoring of chemical, toxic, or drug exposure for individuals. In addition, individual variations might cause parts of people to have higher drug/toxic blood concentration which leads to toxicity. In contrast, parts of people might have lower drug blood concentration which ends in therapeutic failure. In this study, we would like to know if there is a sensitive analytical tool, such as mass spectrometry, which can be applied to drug/toxic monitoring and detection. In addition, we would like to know what range of cost, types of procedure, and for how long to wait for the results are acceptable for population. Mass spectrometry is still not common as a tool for drug/toxic compound monitoring for population. Usually the target compounds need to be selected before method development and the number of targets are limited based on purpose. It is better to have the whole picture of drug/toxic compound monitoring for technicians before starting the method development. In this study, we investigated different parameters of drug/toxic monitoring by using mass spectrometry. The quantified results provided information for technicians to develop suitable mass spectrometry platforms in the future. We also focused on people who work in semi-conductive industry as our population which increased the accuracy of sampling. The results of this study have potential as a reference to facilitate the technique development in the future.