本論文就以針對氮化鎵摻砷進行長波長波段的研究,首先吾人介紹氮化鎵的發展背景與有機金屬氣相沉積磊晶法(MOCVD)及PL量測技,接著吾人在Sapphire上己成長GaN的基板上再使用不同成長條件成長一層GaN,之後,成功的在基板上成長一層GaN後再摻入少量的Arsenic(As)以控制不同的晶格常數以致能控制不同的波長,在成功的成長出Arsenic-doped的GaN後,再進行XRD以及PL的量測。
GaNAs epilayers were grown on GaN/Sapphire substrates by low-pressure metal-organic chemical vapor deposition .Tertiarybutylarsine (TBAs) was used as the As source . first,Introduction the background of development and MOCVD and the measurement of technique for XRD、PL、AFM, To following,Using the different of grow conditions on GaN/Sapphire substrates . After,Doping a few Arsenic(As) to control the lattice constant with the result that control the different wavelength,Successed to grow of Arsenic-doped GaN,proceed to measurement of the XRD、PL、AFM .