- 學位論文
太陽能電池基板之形變量測
Deformation Measurement of the Flexible Substrates of Solar Cells
摘要
隨著科技的演進與世界各國開始注重綠色能源發展，太陽能電池朝向具低成本、可撓曲、不易碎、厚度薄與重量輕之可撓性太陽能電池發展，可撓性太陽能電池因將各功能性薄膜製作於可撓性基材上。雖可撓性太陽能電池具上述之優點，然其結構層與層間因機械性質不同而易產生彎曲變形，進而影響可撓性太陽能電池之效率與壽命，故對於基材之變形探討將是可撓性太陽能電池發展中相當重要之一課題。 本研究使用之基板材料為聚醯亞胺(Polyimide, PI)，其晶體結構近似於單軸晶體(Uniaxial crystal)，故將基板材料為定義為單軸晶體結構，利用材料本身之天然雙折射特性，以光學偏振技術進行理論推導，取得兩束折射光於薄膜材料中傳播之相位差。為了驗證理論與系統之正確性，將PI貼於已知曲率半徑之弧形模具上，將弧形模具放置於光學偏振量測系統中，配合相位移技術以獲得全域相位分部圖，最後使用擬合法求得曲率半徑，以驗證本研究提出量測技術之可行性。
並列摘要
With the evolution of science and global countries’ beginning to emphasize on developing green energy, solar cells have been developed toward low cost, flexibility, infrangibility, thinness, and light weight, with each functional film formed on flexible substrates. Despite the above advantages, with different mechanical properties among layers, flexible solar structure is vulnerable to deformation, which may further influence its efficiency and service life. Thus the investigation of substrate deformation would be a rather important issue for developing flexible solar cells. The substrate material used in this study is Polyimide (PI), whose crystal structure is similar to its uniaxial crystal counterpart, which was thus defined as the material structure of PI. Taking advantage of the natural birefringence properties of the material itself, we conducted theoretical derivation using the optical deflection technique to obtain the phase difference of two reflected beams in the film material, where the PI was pasted on an arc-shaped model with a known radius of curvature that was placed in the optical deflection measurement system. Together with the phase shift technique, it was employed to obtain the complete phase distribution diagrams to verify the accuracy of the system frame. Finally the fitting method was used to obtain the radius of curvature to verify the feasibility of the measurement technique proposed in this study.