運用電腦程式分析檢出液晶顯示器模組異常狀況

Using program to simulate and analyze the defects happened in Liquid Crystal Display Module

吳信岳(Hsin-Yueh Wu)

國立虎尾科技大學/電機資訊學院/光電與材料科技研究所/碩士(2007年)

摘要

本論文研究液晶顯示器模組在生產線及客戶端發生異常時，以最有效率及最快速的電腦程式分析方法，於多種異常狀況中層別出異常主因，進而快速解決產線及客戶端的異常原因。而液晶顯示器模組中尤以IC零件與LCD Cell兩大狀況為最難層別者，若以一般層別方法需將IC零件及LCD Cell拆卸後，重新交叉驗證來層別異常，此分析方法時效過長，且損耗人力及資源，且拆卸過程中有損壞IC零件及LCD Cell的風險。運用電腦程式的分析方式能於不拆卸樣品前提下層別出異常的主因，電腦程式中”Display off”指令之作用為IC工作電壓VDD提供給IC內部運作，但IC內部未提供LCD Cell工作電壓VOP給LCD，即是IC內部依然工作，但輸出至LCD Cell的訊號關掉，之後再藉由觀察IC耗電流大小來層別IC零件及LCD Cell何者異常。而變更掃描方向”COM Direction”指令之作用為藉由改變IC送訊號之方向來快速層別IC與LCD Cell異常，因為IC送訊號方向變更，若異常現象也跟著變更，那一定與硬體LCD ITO線路無關；反之，若是異常現象不變，那就是LCD ITO線路異常了。此電腦程式的分析方式還能導入產線檢測出異常，於電腦程式中利用高頻率檢出ITO線路異常。以及逐步驅動LCD Cell每條ITO線路來檢測短斷路異常等。

並列摘要

This thesis aimed to use the most efficient and fastest computer program analyzing method to stratify the root cause of malfunctioning of Liquid Crystal Display Modules (LCMs) occurred on the production line or at the client side, in order to solve the malfunctions immediately. Among the LCMs, the problems of IC parts and LCD Cells are the most difficult to identify. If using regular Stratification to stratify the malfunctions by cross examination after disassembling the IC parts and LCD cells that will be time-consuming and waste manpower and resource. Also, the disassembly procedure may have risk to damage the IC parts and LCD cells. Using computer program analyzing method could stratify the root cause of malfunction without disassembly, and the “Display off” command in the computer program provides the IC Supply Voltage (VDD) to the IC for internal operation, but the IC inside does not provide LCD cell Operating Voltage (VOP) to LCD. Even the IC inside continues to work, the signal outputs to the LCD cell is turned off. Then the IC power consumption is observed to stratify the malfunctioning occurred in IC parts or LCD cells. “COM direction” command can change the scanning direction to change the direction of IC signal to stratify the malfunctions of IC or LCD cells rapidly. If the IC signal transmission direction changed and the malfunction changed as well, that indicates the defect is irrelevant to LCD ITO circuits. On the contrast, if the malfunction persists, it indicates there would be circuit problems in LCD ITO. The computer program analyzing method also could be conducted into production line for malfunctions inspection which means applying high frequency in computer programs to inspect out the malfunctions of ITO circuit. This analyzing method also could drive each ITO circuit of LCD cell gradually to examine the malfunctions as short circuit.

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