光學同調斷層掃描應用於二維樣品參數量測

The Applications of Optical Coherence Tomography in 2-Dimensional Optical Sample Measurement

李育帆(Yu-Fan Lee)

指導教授 ： 鄭旭志

國立虎尾科技大學/電機資訊學院/光電與材料科技研究所/碩士(2012年)

摘要

光學同調斷層掃描技術(Optical Coherence Tomography)是一種以低同調干涉為基礎的技術，時常用於光學工程的量測或生物醫學上的成像。本研究分成兩個部分，一部分我們將運用OCT技術於量測樣品的折射率，在樣品端對樣品做橫向移動，藉以分析樣品的厚度變化。而在量測過程中，利用Labview控制移動平台的移動以及進行數據的擷取和分析，使得量測過程更加簡單，容易操作；另一部分我們結合4x4耦合器來完成一個新式的OCT技術，可以用來同時量測樣品的折射率和厚度，該方法跟之前相比更加方便以及減少實驗架設的所需時間。

關鍵字

光學同調斷層掃描 ； 折射率 ； 厚度

並列摘要

Optical Coherence Tomography is based on a low-coherent interfere technology, we often use it in the measurement of optical engineering or the imaging of biomedicine. This research is divided into two parts, one part is to use the Optical Coherence Tomography into the measurement of refractive index of sample, and to horizontal movement for sample on sample arm, then we analyzed the variety of thickness of sample, in the process of measurement, by using Labview to control the translation stages also to receive and analyze the measurement of data, it can make the process of the measurement more easier, and to be operated simply; in the other part we combine 4*4 optical coupler to complete a new type of OCT, can be used measure the refractive index and the thickness of sample simultaneously. This method is more convenient than before, and we can also reduce the time of set up the experiment.

並列關鍵字

Optical Coherence Tomography ； refractive index ； thickness

參考文獻

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