以溶劑蒸氣退火法於奈米孔洞內製備高分子奈米材料

高分子奈米材料，在近年來引起了廣泛的研究興趣，因為其特殊的物理與化學特性，並可運用在感測器、藥物釋放、與太陽能電池等應用領域。本論文主要是利用高分子材料-聚苯乙烯 (Polystyrene, PS) ，以溶劑退火法的方式導入陽極氧化鋁模板的奈米孔洞中，並以不同分子量的PS，依照不同的退火時間，來驗證較小分子量的高分子是否會比較大分子量的高分子更快進入陽極氧化鋁模板的奈米級孔洞中。本論文的實驗主要是將PS導入陽極氧化鋁模板孔洞中後，再以選擇性的方式將模板移除，接著以掃描式電子顯微鏡 (Scanning Electron Microscope, SEM) 來觀察、量測在模板孔洞中形成的PS奈米棒大小。另外一個鑑定的方式，就是將PS導入陽極氧化鋁模板孔洞中後，並不移除陽極氧化鋁模板，而是將孔洞外的PS薄膜移除後，用可以溶解PS但不可溶解陽極氧化鋁模板的有機溶劑-四氫呋喃 (Tetrahydrofuran, THF)，來將已導入陽極氧化鋁模板孔洞中的PS溶解出，並以凝膠滲透層析法 (Gel Permeation Chromatography, GPC)，來量測不同大小分子量PS高分子進入陽極氧化鋁模板奈米孔洞中的分佈趨勢。

關鍵字

聚苯乙烯；陽極氧化鋁模板；溶劑蒸氣退火法；分子量；奈米材料

並列摘要

In recent years, polymer nanomaterials have attracted wide research interest because of their special physical and chemical properties. Polymer nanomaterials can also be applied in areas such as sensors, drug delivery, and organic solar cells. This thesis mainly uses polystyrene (PS) as a model material. PS chains with different molecular weights are introduced into the nanopores of anodic aluminum oxide (AAO) templates via the solvent vapor annealing method. We would like to know whether PS with lower molecular weights can be infiltrated into the nanopores faster than PS with higher molecular weights. In the experimental part, the PS chains are first introduced into the nanopores by solvent vapor annealing. After the annealing process, the templates are selectively removed. The resultant polymer nanostructures are characterized and measured by scanning electron microscope (SEM), by which the lengths of the PS nanorods can be determined. Another way to examine the PS nanostructures is to keep the porous anodic aluminum oxide templates. After removing the PS film outside the nanopores, tetrahydrofuran (THF), which can dissolve PS but not aluminum oxide templates, are used to dissolve the PS chains in the nanopores. After that, the polymer nanostructures with different molecular weights are measured by gel permeation chromatography, GPC), for which the molecular weight distribution of the polymers with different molecular weighs can be measured.