In this thesis, we confer on surface plasmon enhanced spontaneous recombination rate in InGaN/GaN multiquantum-well structures. In our experiment, the emission energy of InGaN/GaN multiple quantum wells couple to the electron vibration energy of surface plasmon at the metal-semiconductor surface by depositing metallic thin film on InGaN/GaN multiple quantum wells. To see the modified spontaneous emission rate, the photoluminescence (PL) spontaneous emission rate at different energies was measured by time-resolved PL spectrum experimental setup. We find that the ratio of PL lifetime of the uncoated sample to that of the coated one becomes larger at metal surface plasmon energy. Also, the dispersion relation of three-layer dielectric media is used to calculate the surface plasmon resonance energy to establish our experiment. By comparing the experimental and theoretical results, the occurrence of surface plasmon in our experiment was confirmed. The enhancement of spontaneous emission rate was observed by more than two times.