The thesis consists two parts. In first part, the reflection amplitude and reflection phase of high and low refractive index material are simulated. The accuracy of using reflectance and reflection coefficient to calculate optical constant are compared. It proves that using reflection coefficient can improve the accuracy. In the second part, we measure the interferogram of thin film by using white light scanning interferometer. The reflection amplitude and phase are calculated by transforming the interference information. In order to confirm the stability of our method, we measure four different parts of the sample. And then, we use reflection coefficient and genetic algorithms to fit the optical thickness and refractive index. The measure results are close to that measured by ellipsometry. It indicates our method is feasible.