Fault Diagnosis Simulation and Analysis in Analog Circuits Using Sensitivity Computation

類比電路診錯之靈敏度計算法模擬與分析

柯德祥(Der-Shyang Ker) ； 李雲卿(Yun-Ching Lee)

《中華技術學院學報》 21期 (2000/09) Pp. 78-84

https://doi.org/10.7095/JCIT.200009.0078

摘要

本文以靈敏度計算法與功能測試，對類比電路模組作自動化診錯分析與模擬，確保類比電路之功能正常與簡化故障之診斷維修。並以時域分析代替頻域分析，配合輸入訊號為步階函數，大量減少測試之資料擷取、時間與成本。配合功能測試，選取適當測試點與加入額外已知測試元件，增加其可測性，快速計算出參數值。本文先以MATLAB軟體撰寫程式證明此法之可行性，未來可將此法自行設計之軟體與硬體整合為自動測試裝備。

關鍵字

自動診錯 ； 靈敏度計算法 ； 功能測試 ； 時域分析 ； 類比電路

並列摘要

A sensitivity computation approach and function testing are presented for fault diagnosis of analog circuits in the time domain. The aim is to use dynamic models to enable the estimation of all components of analog circuits that are influenced by faults. The algorithm reduces fault diagnosis time because it uses the step input based on time domain rather than other wave stimuli based on frequency domain. The feasibility of this method is verified using MATLAB software programs and example results are given for detection of faults in this case.

並列關鍵字

Fault diagnosis ； Sensitivity computation ； Time domain ； Anolog circuit