Integrated circuit packaging is a backend process of semiconductor industry. Due to the modeling diversification of assembly, process accuracy is required to higher quality. Ultrasonic wedge bonding is one of the most important interconnection techniques for IC dies inner circuits with the outer world for the power and signal transportation. There is a significant effect of the bonding parameters to the joint quality and reliability. Therefore, the chemical etching method observes the bond configuration and interface characteristics. It is found that the bond interface form the oval-shaped with the increase of the ultrasonic power relation, furthermore, the actual joining position develop from the bond peripheral to the central, and to the whole bond interface. The bond area is increased in the substrate, and the bond strength will be increased relatively.