加速光致衰退測試於工業上的應用

Accelerated Light-Induced Degradation Test for Industrial Applications

林佳玫(Chia-Mei Lin) ； Marcus Gläser ； Dominik Lausch

《科儀新知》 214期 (2018/03) Pp. 82-89

摘要

光致衰退(light-induced degradation, LID)是一種廣泛存在於工業用(單及多晶)矽太陽能電池片上，經由照光或是施加正向電壓後，進而導致電池片效能衰退的現象。衰退的現象源自於複合中心(缺陷)的生成，有效監控LID的程度對工業界來說是必要的。然而，目前針對電池片做LID測試的標準程序尚未建立，此外，傳統LID測試的衰退源－光的硬體保養並不容易。為此，我們訂定以發展出一台可以提供可靠，快速的工業用LID測試機台做為目標。本文即針對機台研發的過程及其在工業上的應用作介紹。

並列摘要

Light-induced degradation (LID) is a well-known problem of industrial silicon solar cells and can lead to severe electrical performance loss through the formation of recombination-active defects during the excess carrier injection by illumination or forward biasing. Thereby an effective LID inspection for industry is essential. Unfortunately, a standard LID test procedure based on the solar cell level is currently missing. Moreover, the maintenance of the traditional degradation source - light is challenging. In order to solve these concerns, our goal of this work is to develop a reliable and rapid LID test procedure upon a customer friendly LID test machine. This article introduces the development process of the machine and its industrial applications.