降低測試間之等待時間 提升IC測試機之效率

Improving the efficiency of IC test machine: The control of index time

吳明穎(Ming-Ying Wu)

指導教授 ： 陳建良

國立清華大學/工學院/工業工程與工程管理學系碩士在職專班/碩士(2014年)

摘要

台灣的半導體產業發展已趨成熟，淬煉出在全球半導體產業獨樹一格的垂直分工經營模式，屬於供應鏈後段的IC測試產業在代工能力或產值規模上在全球皆排名首位。
各整合元件大廠(Integrated Device Manufacturer）競爭激烈，由於成本的考量，成熟產品的測試時間呈現縮短之趨勢，因而測試產業面臨著如何維持生產效率之問題。以工廠而言，產能效率的高低，就是競爭力的衡量指標，提昇其生產效率，對目前測試產業來說，已是一個相當重要的課題。
由於短測試時間之限制，機台浪費許多等待著測試的時間。本研究在影響測試生產效率的各因素中，針對短測試時間之機台於測試間之等待時間(Index time)的影響因素進行分析，以提升機台效率產出做出具體的探討，並以台灣某半導體封裝測試廠為實證，使用要因分析圖與實驗設計法找出影響IC測試機Index time的顯著影響因子，計算出造成機台效率之損失，進而提出改善方案，提高生產效率，平均減少短測試時間19%的minimum time時間，意即增加了19%產出。

關鍵字

測試時間 ； 生產效率 ； 因子

並列摘要

The semiconductor industry in Taiwan has become a mature industry, whose industry structure is a unique vertical separation model compared to that of the other countries. Taiwan’s IC testing business, which belongs to the downstream part of the semiconductor supply chain, is top-notch in the world in terms of the OEM capability and the scale of output value.
It is quite competitive nowadays among integrated device manufactures. Considering the cost, the testing time in mature products has been significantly reduced, which means IC testing companies need to improve production efficiency to keep their competitiveness. For factories, production capability is a key competitiveness index so that how to improve production efficiency is a very important subject for IC testing companies.
Machines easily become idle due to short testing time. This research focused on the factors which had influence on the idle time in short testing time machines and tried to improve production efficiency of machines. In addition, the research was applied to a semiconductor testing company in Taiwan. Causes and effects chart and design of experiment were used to look for the significant factors affecting idle time of IC testing machines so that the capacity loss can be minimized. According to the factors, some proposals were put forward to raise the production efficiency, average reduction 19% of the short test time’s minimum time which means an increase of 19 percent of output.

並列關鍵字

Test time ； Production efficiency ； Factor

參考文獻

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