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利用軟X光吸收能譜剖析材料

Probing Materials by Soft X-ray Absorption Spectroscopies

摘要


由於不同元素的內層電子能階各異,X光吸收能譜(X-ray absorption spectroscopy)可提供複雜材料各組成元素的電子結構,使我們能進一步了解其傳輸性質與磁表現背後之機制。相較X光吸收能譜可提供電子組態之資訊,利用X光磁圓偏振二向性(X-ray magnetic circular dichroism)可得到各元素的自旋與軌道磁矩,而X光線偏振二向性(X-ray linear dichroism)則可探測反鐵磁結構。本文將簡介這幾項實驗技術,並簡述如何利用其探索磁垂直異向性、稀磁半導體以及異質結構之介面效應。

並列摘要


Owing to different binding energies of distinct elements, X-ray absorption spectroscopy could provide the detailed information concerning the electronic structures of the constituent elements in complex materials. Based on this, we could investigate their transport properties and magnetic behaviors, further to understand the underlying mechanism. Besides the electronic structures extracted from X-ray absorption spectra, orbital moment and spin moment of each element could be determined by use of X-ray magnetic circular dichroism. On the other hand, X-ray linear dichroism could probe antiferromagnetic structures. In this article, we would give a brief introduction on those techniques and further to describe how they are involved in different fields, such as perpendicular magnetic anisotropy, diluted magnetic semiconductor, and heterostructure.

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