Quality Improvement in Cleaning Process for TFT-LCD Production

Chin E. Lin ； Chun-Mu Lin

《Journal of Aeronautics, Astronautics and Aviation》 46卷4期 Vol.46 No.4 (2014/12) Pp. 249-257+259-260

https://doi.org/10.6125/14-0307-785

並列摘要

Thin Film Transistor Liquid Crystal Display (TFT-LCD) production pastes the polarizer onto glass panel using paste roller. TFT-LCD quality is affected by some inefficient cleaning work in polarizer pasting process to cause panel deface and leave residual glue behind in light leak. The clean processing becomes the key in quality assurance of TFT-LCD production. This paper adopts the Taguchi Experiment Method in experiment design and test to improve the G8.5 42＂ TFT-LCD production quality control. The affecting parameters concerning brush direction, speed, nip and conveyer speed are considered into the orthogonal array for experiments to find the best control adjustment. The objective of this study investigates the quality assurance in automatic TFT production. From production line tests, the production yield accomplishes 0.06% improvement of residual variation from 0.19% to 0.13%. It is significant improvement in TFT-LCD mass production.

並列關鍵字

Thin Film Transistor Liquid Crystal Display ； Taguchi Experiment Method ； Residual Glue ； Polarizer Film Rework