高功率發光二極體於熱環境下之
壽命分佈與可靠度分析

有限元素分析常被用來模擬並探討高功率發光二極體之力學與熱傳行為，然而卻鮮見人們依分析結果繼續探討發光二極體之壽命分佈與可靠度等問題。本研究首先依據某一公司所生產高功率發光二極體在不同環境溫度下之實測壽命，建立晶片接面溫度(junction temperature)與壽命間之關係式，然後再依有限元素方法模擬分析該二極體發光時之晶片溫度與壽命，特別的，本研究依實際觀察，將光電轉換效率和熱對流係數等不確定性以隨機變數視之，並以蒙地卡羅方法抽樣模擬此些變數，代入有限元素與前述之壽命分析中，最後再藉由機率圖法探討該高功率發光二極體之壽命分佈，結果顯示所有環境情況下之壽命分佈皆適合以三參數韋伯分佈來描述，而由機率圖法所獲取之參數可推得各環境情況下之可靠度函數與機率密度函數，進而分析高功率發光二極體使用時間與可靠度及失效率之關係。最後建立晶片接面溫度與壽命平均值及標準偏差關係式，藉由關係式即可快速判斷在某一晶片接面溫度下之發光二極體壽命分佈。

關鍵字

發光二極體；晶片接面溫度；參數不確定性；壽命分佈；可靠度

並列摘要

Finite element analysis is frequently employed by researchers to investigate the mechanics and/or thermal behaviors of high-power light emitting diodes (LED). Unfortunately, after performing finite element analysis, only a few people continue to discuss the life and reliability of the LED. In the present study, a relationship between the junction temperature and the life of a LED is established first based on real test data. Finite element analysis is then employed to find the junction temperature of the LED. Afterwards, the life of the module is predicted based on the relationship mentioned above. To account for possible uncertainties, parameters such as the heat transfer coefficient and the photoelectric conversion efficiency are considered random variables. Monte Carlo method for simulating samples of these random variables is employed in the finite element analysis and life prediction of the LED. An amount of lives indicating a random sample out of the studied LED are obtained, even under the same temperature and environmental condition. Statistical analysis is finally employed to find the life distribution and reliability of the LED. The result is very important to both LED manufacturers and consumers.

並列關鍵字

High-power light emitting diode (LED) ； junction temperature ； parameter uncertainty ； life distribution ； reliability.

參考文獻

31. 陳泰宏，光源空間配置與積分球光通量量測誤差相關性之研究，國立暨南國際大學光電科技碩士論文，2013。

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國際替代計量

高功率發光二極體於熱環境下之壽命分佈與可靠度分析

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