掃描鏈分割與重排之掃描鏈黏著性錯誤診斷技術

A Scan Chain Partition and Reordering Technique for Scan Chain Stuck-At Fault Diagnosis

游智凱(Jhih-Kai You)

指導教授 ： 李建模

國立臺灣大學/電機資訊學院/電子工程學研究所/碩士(2005年)

https://doi.org/10.6342/NTU.2005.02102

摘要

為改善掃描鏈之單一黏著性錯誤之診斷解析度，本研究提出掃描鏈之分割與重排技術。掃描鏈分割技術即將單一條掃描鏈分割為兩條以上。掃描鏈分割技術可藉由解決可控制性問題及可觀察性問題來改善診斷解析度。掃描鏈重排技術即改變掃描正反器之排列順序。掃描鏈重排技術可藉由打斷連續之不可觀察的掃描正反器來改善診斷解析度。為降低掃描鏈重排所造成之繞線增加，本研究亦支援以叢集為基礎之重排技術。實驗結果證明所提出之技術可有效改善診斷解析度。

關鍵字

掃描鏈 ； 分割 ； 重排 ； 叢集 ； 診斷解析度 ； 平均診斷解析度 ； 最差診斷解析度 ； 輸入測試方塊矩陣 ； 輸出響應矩陣

並列摘要

Scan chain partition and reordering techniques are proposed to improve the diagnosis resolutions of scan chain single stuck-at faults. Scan chain partition separates a scan into two or more chains. Scan chain partition improves diagnosis resolutions by solving controllability problems and observability problems. Scan chain reordering changes the order of scan cells. Scan chain reordering improves diagnosis resolutions by breaking the continuous unobservable scan cells. Cluster-based reordering is supported to improve the scan chain wiring overhead. Experimental results shows the proposed techniques are effective.

並列關鍵字

scan chain ； partition ； reordering ； cluster ； diagnosis resolution(DR) ； average DR ； worst DR ； ITCM ； ORM

參考文獻

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