五埠互易性元件的量測技術

Measurement Technique for Reciprocal Five-port Devices

余浩茗(Hao-Ming Yu)

指導教授 ： 李士修

國立臺北科技大學/電資學院/電腦與通訊研究所/碩士(2012年)

https://doi.org/10.6841/NTUT.2012.00443

摘要

本論文提出量測五埠元件的方法，是以四埠向量網路分析儀為量測工具，並考慮到第五埠未量測埠須連接之匹配負載的不完美匹配之效應，而推導出適用於全對稱和半對稱五埠元件之S參數的量測及校正方法。文中將會對本校正技術進行理論分析及其公式推導，並以模擬方法先行驗證，最後以全對稱和半對稱電路為實例，比較提出之量測技術所得的最終校正值與高頻結構模擬軟體(High Frequency Structure Simulator, HFSS)所得到之頻率響應，而以此兩實例所產生之校正結果與模擬具有一致性，其誤差分析的結果也顯示，所提出的校正算式不會擴大信號誤差的範圍，如此證實本校正技術可運用於四埠向量網路分析儀進行五埠的精密量測。

關鍵字

5埠元件 ； TRL ； 向量網路分析儀 ； 校正 ； 誤差分析

並列摘要

This thesis presents a measurement technique for reciprocal five-port devices. The technique employs four-port vector network analyzers to conduct required measurements. The reflection from the unmeasured port terminated with a non-ideal 50Ω termination is taken into account. The calibration equations for measuring the scattering parameters of full-symmetric and semi-symmetric five-port devices are developed. Theoretical analysis and formula derivation are presented in this thesis. The accuracy of the proposed technique is verified through a simulation tool first. Then the calibrated results of the design examples for full-symmetric and semi-symmetric devices are compared with the frequency responses from a commercial EM simulator. The comparison shows a good agreement. Further error analysis shows the inherent errors introduced by measurement instruments are not deteriorated by the calibration equations. The measurement technique herewith is proved to be useful for measuring five-port devices using four-port vector network analyzer.

並列關鍵字

5-port devices ； TRL ； Vector Network Analyzer ； Calibration ； Error Analysis

參考文獻

[6] 林育晟，探討利用雙埠TRL校正技術量測三埠元件之方法，碩士論文，國

[7] 陳書揚，量測互易且對稱之四埠元件的雙埠TRL校正技術，碩士論文，國

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[3] Network Analysis Basics, Agilent Technologies, pp. 34-45, 2000.