CMOS-MEMS熱掃瞄探針的設計與製作

Scanning Thermal Microscopy （SThM）是一種以探針掃瞄樣品表面而得到溫度分佈曲線在奈米等級解析度的方式，目前已經有少量商品化儀器在市場上。過去在文獻中曾出現以薄膜式bolometer、熱電偶、及Shottky diode 製作感熱的機制；例如：用polyimide作結構材料，用Ni/W作熱電偶，發展出一套與CMOS相容的六個光罩製程。而係數所有相關文獻，如今並沒有任何SThM探針與CMOS已完全整合，事實上最大的挑戰仍在製程，而這也是我們製作CMOS-MEMS SThM探針陣列的最主要動機之一。本研究旨在設計及製作微探針掃描陣列用以掃瞄待測物表面的溫度分佈，而藉由尖銳的探針作為熱感測介面，達到接近奈米等級的掃瞄解析度。目前相關文獻中尚未出現與CMOS整合的相關研究，同時在探針掃瞄高度的伺服控制上相關的研究幾乎少見；針對這兩點，我們創先提出CMOS-MEMS熱掃瞄探針的製作概念及設計，利用現成CMOS材料作thermopile的熱電式感測，並利用絕緣層作探針結構的絕熱設計；在進行熱掃瞄之同時，探針與掃瞄表面需維持固定的掃瞄接觸力，所以我們將採用壓阻式感測提供探針接觸力，用以驅動一熱致動器以維持探針與掃瞄表面接觸力。針對探針未來的陣列化，與CMOS結合並採on-chip掃瞄探針高度控制的方式具有非常大的優勢。

關鍵字

微機電；熱電偶；熱掃瞄探針；西貝效應；互補式金屬氧化層半導體；熱時間常數

並列摘要

The goal of this research is to design and to fabricate CMOS micromachined probes for scanning thermal microscopy that enable quantitative nanometer-scale study of thermal properties for the sample by the deposited tip. CMOS materials are used for thermoelectric sensing. The dielectric layer in the structure is used for thermal isolation. During a scanning thermal process, the contact force between the probe and the sample must be constant. We thus integrate the piezoresistor and thermal actuator into a scanning thermal microscopy. According to all of the above, scanning thermal microscopy can detect thermal spatial resolution in nanometer-scale by using a probe to scan the sample surface. Prior work has used bolometer, thermocouple, and shottky diode for detection. In all of the relevant publications, there is no scanning thermal microscopy integrated completely with CMOS technique, and this is what we aim to accomplish.

並列關鍵字

CMOS ； MEMS ； SThM ； Thermocouple ； Scanning Thermal Probe ； Thermopile

參考文獻

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[3] A. Majumdar, J. Carrejo, J. Lai, “Thermal Imaging using the atomic force microscope,” Applied Physics Letters, Vol. 62, pp. 2501-2503, 1993.

[5] A. Schaufelbuhl, N. Schneeberger, U. Munch, M. Waelti, O. Paul, O. Brand, H. Baltes, C. Menolfi, Q. Huang, E. Doering, M. Loepfe, “Uncooled low-cost thermal imager based on micromachined CMOS integrated sensor array,” J.Microelectromech. Syst, no. 10, pp. 503-510, 2001.

[6] C. C. Williams, H. K. Wickramsinghe, “Scanning thermal profiler,” Appl. Phys. Lett, vol. 49, no. 23, pp. 1587-1589, 1986.

[7] K. Luo, Z. Shi, J. Varesi, A. Majumdar, “Sensor Nanofabrication, Performance, and Conduction Mechanisms in Scanning Thermal Microscopy,” Journal of Vacuum Science and Technology B, Vol.15, pp. 349-360, 1997.

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CMOS-MEMS熱掃瞄探針的設計與製作

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