考量位置下掃描鏈排序重置之掃描鏈診斷

Location Aware Scan Chain Reordering for Scan Chain Diagnosis

林明賢

指導教授 ： 黃婷婷

國立清華大學/電機資訊學院/資訊工程學系/碩士(2012年)

https://doi.org/10.6843/NTHU.2012.00471

摘要

由於掃瞄鏈 (scan chain)的故障佔據了良率損失 (yield loss)上的很大比例，所以在掃瞄鏈的診斷已經成為當今非常關鍵的議題。在這篇論文中，針對掃瞄鏈的診斷我們提出了掃瞄鏈上排序重置的方法來改善掃瞄鏈錯誤的發生。這個掃瞄鏈上排序重置的方法使用雙邊配對 (bipartite matching)演算法來減少可能發生錯誤的掃瞄正反器 (scan flip flop)的範圍。接著使用模擬退火 (simulated annealing)演算法來降低由於重置掃瞄正反器排序所需付出的代價。實驗結果顯示我們所提出的方法能夠有效的減少可能發生錯誤的掃瞄正反器的範圍。

關鍵字

掃描鏈 ； 掃描鏈診斷

並列摘要

Because scan chain failure is responsible for a large percentage of yield loss, scan chain diagnosis has become a critical issue in modern technology. In this paper, we present a scan chain reordering algorithm to improve scan chain fault diagnosis resolution. The ordering of scan cells is performed to decrease the range of suspect faulty scan cells by a bipartite matching reordering algorithm. Then simulated annealing algorithm is used to refine the wire length overhead. The experimental results show that our approach can effectively reduce the number of suspect scan cells for most cases of ITC'99 benchmarks.

並列關鍵字

Scan Chain Diagnosis ； Scan Chain Reordering

參考文獻

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S. Kundu, ``Diagnosing Scan Chain Faults,'' IEEE TVLSI, Vol. 2, No.4, pp. 512-516, December 1994.

S. Edirisooriya, G. Edirisooriya, ``Diagnosis of Scan Path

K. De, A. Gunda, ``Failure Analysis for Full-Scan ircuits'',

S. Narayananan, A. Das, ``An Efficient Scheme to Diagnose Scan Chains,'' Proc. ITC, pp. 704-713, 1997.