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  • 學位論文

積體電路中金屬化製程之 積體電路中金屬化製程之電鍍銅沉積的研究

The study of Cu electroplating for ULSI metallization

指導教授 : 鄭俊麟
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摘要


中文摘要 在未來元件發展過程中,銅金屬扮演相當重要的角色,因為銅相對於鋁而言,具有較低的電阻值和較高的遷移阻抗特性。此外,銅可以利用物理汽相沈積,化學汽相沈積,無電鍍法或化學電鍍法來進行沈積,但以化學電鍍法沈積銅膜,具有下列的優點,(1)低成本,(2)高品質,(3)低製程溫度以及(4)高沉積速率,若再配合使用適當的化學添加劑,更能有效的將銅金屬填充於微細的孔洞中而不會有孔洞、空隙與細縫等缺陷產生,所以是目前銅金屬沉積方式中,被視為未來應用於深次微米之銅金屬化製程中最重要的技術之一。 本研究中,我們首先先討論操作條件如何影響化學電鍍銅的沉積,接著我們將藉由電極動力學的理論來討論電極上極化現象如何的發生。以及極化現象的種類並探討極化作用對電鍍反應與銅膜性質的影響。其次,我們在電鍍液中分別加入硫尿添加劑與其它兩種的硫尿衍生物,(N、N-雙乙基硫尿與N-乙醯硫尿)。當加入具有推電子之官能基(乙基)的N、N-雙乙基硫尿時,由於乙基具有推電子的特性,因此會增強獨立電子上的電子密度而影響銅離子的反應活化能,導致較大的極化效應產生。最後利用此增強極化效應的特性,可順利將銅填入於一1.5:1深寬比之0.4μm的孔洞中而無孔洞及細縫等缺陷產生。 此外,我們也在電鍍液中分別加入硫尿、聚乙二醇與鍵那斯藍添加劑,以探討此三種添加劑所引起的活性極化效應與平滑能力對化學電鍍銅沉積的影響。我們藉由循環式伏特剝離法來探討加入不同添加劑時所產生之活性極化大小與銅膜沉積量的關係,並利用循環式伏特剝離法配合旋轉電極來測量加入不同添加劑時所展現的平滑能力,並預測其填洞效果,最後以X光繞射儀來判別銅金屬結晶方位,以電子掃描顯微鏡來觀察銅膜沉積的表面形態,量測沉積速度以及觀察銅金屬在栓塞之填充情形。根據我們的實驗結果,我們發現發現加入鍵那斯藍後,其提高的活性極化效應會得到良好的平滑能力,如此可展現其supper-filling的沉積方式,順利將銅填入於一4:1深寬比之0.3μm的孔洞中而無孔洞及細縫等缺陷產生。

並列摘要


Abstract Chemical additives play important roles in copper electroplating, because it could effect on film quality as well as gap filling. However, a fundamental understanding of the roles of chemical additives is still deficient. In order to illustrate the roles of chemical additives in copper electroplating, the technique of cyclic voltage stripping (CVS) together with rotating disk electrode (RDE) is proposed to be used studying the roles of chemical additives on copper electroplating. Based on my study, my research resultes are shown that film nucleation and film deposition rate could be correlated with how strong interaction of chemical additives with copper ions. According to CVS measurements, the additive (N,N-diethylthiourea) with electron-push groups could make strong interaction with copper ions and higher polarization as well. This effect would bring N,N-diethylthiourea to help copper filling easier in a 0.4μm feature dimension with an aspect ratio of 3. In addition, a good leveling additive could not only make higher polarization but also bring good leveling effect. The leveling effect could be correlated with the RDE measurements. According to my study, a good leveling additive would display good leveling effect when the electrode rotating speed is faster. Since a thinner diffusion layer would be produced when rotating speed is faster. The thinner diffusion layer could make leveling additive strongly interact with copper ions and produce good leveling. This is the reason why Janus Green B could be act as a leveling agent, but thiourea and polyethylene glycol couldn’t.

參考文獻


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