C60薄膜之C-V特性量測

C-V Characterization Measurement of C60 Films

蕭檉譁(Cheng-Hua Hsiao)

指導教授 ： 邱寬城

中原大學/理學院/應用物理研究所/碩士(2001年)

https://doi.org/10.6840/cycu200100490

摘要

中文摘要

本文探討溫度從20 K ~ 300 K變溫過程中利用C-V量測在頻率1M Hz下來測量C60三明治結構樣品( Au / C60 / Au ) 的介電常數κ、交流電導率σ及介電鬆弛時間常數(dielectric relaxation time constant) τ與溫度之關係。在室溫下C60 的介電常數為4.3 ±0.2，這與文獻所記載的大致相同。而在介電常數－溫度的曲線中，可觀察到在溫度256 K左右有相變的發生，同時在100 K時也觀察到玻璃轉變(glass transition)的現象。並利用Arrhenius polt對lnτ與1000 / T做圖，分別求得在有序/無序時相變前後的活化能約為112 meV (fcc)及256 meV (sc)，此值與文獻記載的相差不遠。

關鍵字

碳六十薄膜 ； 電容電壓量測

並列摘要

Abstract

In this report, by using by C-V measurement at frequency 1M Hz from 20 K to 300 K, we measure the relations of the dielectric constant κ , ac conductance σ and dielectric relaxation time constant τ with respect to temperature of C60 sandwiched sample ( Au / C60 / Au ). The dielectric constant of C60 is 4.3 ±0.2 at room temperature, which is close to the published results. From the curve of dielectric constant versus temperature, we have observed that the changes due to order / disorder phase transition and glass transition. Meanwhile, by using the Arrhenius plot of lnτversus 1000 / T, the values of activation energy are calculated to be 112 meV (fcc) and 256 meV (sc) with respect to the rotational order / disorder phase transition respectively.

並列關鍵字

C-V measurement ； C60 film

參考文獻

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