原子力顯微鏡在作用力方面的一些探討

Study of Some Force Related Reaction Using Atomic Force Microscopy

莊偲玄(Ssu-Hsuan Chuang)

指導教授 ： 傅傳博

國立暨南國際大學/科技學院/應用化學學系/碩士(2017年)

摘要

原子力顯微鏡在近年來被廣泛應用於奈米材料或是生物樣品的表面研究，因為原子力顯微鏡具有奈米級的解析度、很好的靈敏度以及不容易損壞樣品，還可以在各種的環境中進行測量，所以非常適合應用在生物科學的研究。本篇是利用原子力顯微鏡在水溶液的環境中，在探針上修飾 Anti-BSA；在玻片上修飾 BSA ，並且利用anti-BSA 與BSA之間的特異性作用，進行兩者之間的力對距離曲線分析，以達到分子辨識的目的。

關鍵字

原子力顯微鏡 ； 力對距離曲線

並列摘要

Atomic force microscopy (AFM) has been used for surface study of nanomaterials and biosamples. It is suitable to study bioscience because it has nanometer resolution, good sensitivity and also can be used in aqueous solution for various applications. In this study, AFM is used for analyzing the force-distance curve between the anti-BSA tip and BSA substrate. We use the interaction between the anti-BSA and BSA to achieve the technique of molecular recognition.

並列關鍵字

Atomic force microscopy ； Force-distance curve

參考文獻

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