- 學位論文
裸晶測試探針耐久最佳化實驗研究
Durable and Optimum Experimental Research for Dies Test Probe
摘要
LED 為 Light emitting diode 的縮寫，中文名為「發光二極體」，是一種以半導體為發光材料的發光元件。其原理是因半導體中的載子產生復合而放出光子，所以沒有燈絲發光有發熱、易燒等缺點，其發光波長取決於材料的能隙，可涵蓋紫外到紅外的波長範圍。LED 的照明產品就是利用 LED 作為光源而製造出來的照明器具。LED 被稱為第四代照明光源或綠色光源，因為其具有節能省電、環保、壽命長、體積小、響應快、抗震動性好等優點，可以廣泛應用於各種指示、顯示、情境裝飾、背光源、普通照明、城市夜景汽車頭燈等，尤其在節能省電的問題上，LED 是目前取代燈泡的最佳首選。 晶粒是發光二極體終端產品的心臟，LED顏色及亮度都與晶粒的製作有關，而探針則為鑑定晶粒良率，決定最後使用範疇的重要媒介。經由探針測試實驗所得之數據及業界的需求反應得知：鈹銅探針的材質與製作過程參數是影響晶粒的鑑定良率結果的最大因素。電壓藉由探針通入晶粒，晶粒即產生亮度，而其亮度與波長所表現出的數據，則決定著晶粒的分類及是否被用以生產照明設備。本研究成果亦證實探針與晶粒良率的關聯度。
並列摘要
LED stands for Light Emitting Diode; its Chinese name is "Light Emitting Diode". It is a lighting element that uses semiconductor as the lighting material. The principle theory of the LED is the carrier of the semiconductor releases photons during the composite process. It will not have the traditional filament light which generates heat, easy to burn out and other disadvantages. The light emission wavelength is depending of the material bandgap that can cover the range from ultraviolet to infrared. The LED lighting product is created by using LED as the source of light. The Led light is called the fourth generation light source or the “Green” light source. It has the benefits of energy saving, environmental friendly, long use of life, compact size, fast response, anti-vibration and more. The applications of LED lighting include various of direction light, display light, decoration light, backlighting, general purpose light, urban landscape light, automobile light, and others. It is best choice to replace the traditional bulb especially in the issue of energy saving. Dies are the most critical element of the final product of light-emitting diode. The color and brightness of the LED are associated with the production process of dies. The Beryllium copper test probe is the device to verify the die yield and scope of final usage. Base of the experimental data and the requirements from the industry, the test probe’s material, characteristic parameters and production process are the major factor that affects the grain’s yield. Voltage probes pass into the die by die which produce the brightness, and the brightness and wavelength is shown by the data, then determines whether the die is used to produce the classification and lighting equipment. The result of this research confirms the test probe and die yield are correlated.