強度型穿透式三維顯微鏡術之研究

本論文提出「強度型穿透式三維顯微鏡術」，本方法係以臨界角強度法檢測技術結合CCD影像擷取技術來量測透明待測物細微之表面輪廓。當光束經過透明待測物時，由於待測物表面的高度變化，造成穿透的光束有些微角度偏移，以致於入射至平行四邊形稜鏡時，偏離了原先靠近臨界角的角度，而造成靈敏的出射光強度增減。因此待測物的表面高度變化與穿透光強度比反射率成正比，故可利用反射率變化來描繪待測物的表面形貌。最後就可以利用CCD所擷取到的反射率變化來描繪待測物的三維表面顯微形貌。

關鍵字

臨界角；角度偏移；表面形貌；眼蟲；草履蟲

並列摘要

In this research, we proposed an intensity transmission type three-dimensional (3D) microscopy. The new optical microscopy is based on the critical angle method and the use of CCD detection technology to measure the 3D profile of a transparent specimen. When the beam passes through the transparent specimen, the surface height of each test point causes its output ray deflect a slight angle. Then, let the ray incident into a parallelogram prism. The incident angle deviated a small angle from the original angle is near at the critical angle, it results in a sensitive change of intensity of the reflective light. Thus the reflectivity of light is proportional to the surface height. Using a CCD camera to catch the image and using the MATLAB program to analyze the surface height, we could use the linear transform from reflectivity to height to describe the 3D profile of the specimen.

並列關鍵字

critical angle method ； angle deviation microscopy ； 3D profile ； Euglena ； Paramecium

參考文獻

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[21] 林逸智，「CCD臨界角法橫向位移量測之研究」，虎尾科技大學，碩士論文，民國99年。

[2] S. E. D. Webb , S. R. Needham , S. K. Roberts , and M. L. Martin-Fernandez , "Multidimensional single-molecule imaging in live cells using total-internal-reflection fluorescence microscopy" , Opitcs letters, 31,2157-2159, 2006.

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[6] J. A. O'Keefe , "Resolving power of visible light" , J. of the Opt. Soc. Of America, 46, 359, 1956.

被引用紀錄

楊亞鑫（2013）。穿透式雙軸角度偏向三維光學顯微鏡〔碩士論文，國立虎尾科技大學〕。華藝線上圖書館。https://doi.org/10.6827/NFU.2013.00099

國際替代計量

強度型穿透式三維顯微鏡術之研究

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