In this thesis, microcrystalline silicon films are deposited at low temperature (110~300℃) from silane, highly diluted in hydrogen-argon mixtures. Argon addition during the deposition allows to increasing the crystallinity. Based on the experimental results, it is proposed that crystallization of μc-Si:H is mediated by the energy transferred from energetic argon atoms. For thin film transistors processed in the bottom gate configuration at 200℃, showing the mobility higher than 2 cm2/V-s.