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製程溫度對脈衝雷射蒸鍍法製備之氧化鋅導電薄膜的特性影響

Influence of the Substrate Temperature on the Properties of ZnO Thin Films Grown by Pulsed Laser Deposition

摘要


本研究使用脈衝雷射蒸鍍法在玻璃基板上以不同基板溫度製備氧化鋅薄膜,由X光繞射儀及原子力顯微鏡量測中顯示本研究所製備之氧化鋅薄膜爲六方最密堆積結構,而且沿c軸的優先取向,實驗中發現晶粒大小會隨基板溫度增加而增大;電性部分,實驗顯現氧化鋅導電電阻率隨著基板溫度的增加而迅速減少,在基板溫度150℃時可得到最低值爲1.74×10^(-3) Ω-cm;光學量測中發現利用穿透光譜算出的能隙在3.2~3.3 eV 之間,其能隙大小會隨著基板溫度的增加而縮小,而此藍移現象可能是由於晶粒很小產生近似量子效應所影響。

並列摘要


Pulsed laser deposition (PLD) technique is used to deposit undoped ZnO thin films at different substrate temperatures on glass substrates. XRD and atomic force microscopy (AFM) studies indicated that the obtained ZnO thin films were hexagonal wurtzite type structure with strong (002) c-axis orientation. The resistivity decreased rapidly with the increase of substrate temperature to a minimum of 1.74×10^(-3) Ω-cm at 150℃, and then increased. The band gap energy, measured from reflectance spectra, lies between 3.2 and 3.3 eV. There is an absorption edge blue shift with decreasing the substrate temperature. This shift obeys an inverse relation with the average crystallite size, typical of quantum confinement effect in very small nanoparticles.

參考文獻


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